Optical properties of silicon light trapping structures for photovoltaics

Solar Energy Materials and Solar Cells

Volumn 94, Issue 12, 2010, Pages 2251-2257

  Iyengar, Vikram V ^a   Nayak, Barada K ^a   Gupta, Mool C ^a  

^a University of Virginia   (United States)

Author keywords

Laser processing; Light trapping; Optical properties; Silicon; Solar cells; Ultrafast lasers

Indexed keywords

ANGLE OF INCIDENCE; ANGULAR RANGE; BROAD SPECTRAL; GAS AMBIENTS; LASER PROCESSING; LIGHT TRAPPING; LIGHT TRAPPING STRUCTURES; PHOTOVOLTAIC DEVICES; PHOTOVOLTAIC PARAMETERS; PHOTOVOLTAICS; POROUS SILICON SURFACES; REFLECTION LOSS; SILICON BAND GAP; SILICON SURFACES; SURFACE-TEXTURING; TEXTURED SURFACE; THIN FILM SILICON; TOTAL REFLECTION; ULTRA-FAST; ULTRAFAST LASER;

ANTIREFLECTION COATINGS; CONVERSION EFFICIENCY; CRYSTALLINE MATERIALS; LIGHT REFLECTION; MATERIALS PROPERTIES; NANOWIRES; OPTICAL PROPERTIES; PHOTOVOLTAIC EFFECTS; POROUS SILICON; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SOLAR CELLS; SOLAR POWER GENERATION; SULFUR; SULFUR HEXAFLUORIDE; SURFACES; ULTRAFAST PHENOMENA;

ULTRAFAST LASERS;

EID: 77957664369     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.07.020     Document Type: Article

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