Characterization of laser-fired contacts in PERC solar cells: SIMS and TEM analysis applying advanced preparation techniques

Applied Surface Science

Volumn 252, Issue 19, 2006, Pages 7082-7085

  Zastrow, U ^a   Houben, L ^a   Meertens, D ^a   Grohe, A ^b   Brammer, T ^a   Schneiderlochner E ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

Laser fired contact; Microdiffraction analysis; Sample preparation; SIMS; Solar cell; TEM

Indexed keywords

DIFFRACTION; ION BEAMS; LASER BEAM EFFECTS; SECONDARY ION MASS SPECTROMETRY; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

LASER-FIRED CONTACT; MICRODIFFRACTION ANALYSIS; SAMPLE PREPARATION;

SOLAR CELLS;

EID: 33747167657     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.02.114     Document Type: Article

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