-
1
-
-
35449007420
-
Investigation of material-induced shunts in block-cast multicrystalline silicon solar cells caused by SiC precipitate filaments
-
Paris
-
Rifai MHA, Breitenstein O, Rakotoniaina JP, Werner M, Kaminski A, Quang NL. Investigation of material-induced shunts in block-cast multicrystalline silicon solar cells caused by SiC precipitate filaments. In 19th EPVSC, Paris, 2004; 632.
-
(2004)
19th EPVSC
, pp. 632
-
-
Rifai, M.H.A.1
Breitenstein, O.2
Rakotoniaina, J.P.3
Werner, M.4
Kaminski, A.5
Quang, N.L.6
-
2
-
-
35448946231
-
Distribution and formation of silicon carbide and silicon nitride precipitates in block-cast multicrystalline silicon
-
Barcelona
-
Rakotoniaina JP, Breitenstein O, Werner M, Al-Rifai MH, Buonassisi T, Picket MD, Ghosh M, Mueller A, Quang NL. Distribution and formation of silicon carbide and silicon nitride precipitates in block-cast multicrystalline silicon. In 20th EPVSC, Barcelona, 2005.
-
(2005)
20th EPVSC
-
-
Rakotoniaina, J.P.1
Breitenstein, O.2
Werner, M.3
Al-Rifai, M.H.4
Buonassisi, T.5
Picket, M.D.6
Ghosh, M.7
Mueller, A.8
Quang, N.L.9
-
3
-
-
3843099656
-
Comparison of different techniques for edge isolation
-
Hauser A, Hahn G, Spiegel M, Feist H, Breitenstein O, Rakotoniaina JP, Fath P, Bucher E. Comparison of different techniques for edge isolation. In 17th EPVSEC, 2001; 1739-1746.
-
(2001)
17th EPVSEC
, pp. 1739-1746
-
-
Hauser, A.1
Hahn, G.2
Spiegel, M.3
Feist, H.4
Breitenstein, O.5
Rakotoniaina, J.P.6
Fath, P.7
Bucher, E.8
-
4
-
-
6344228597
-
Scanning Nd: YAG laser system for industrially applicable processing in silicon solar cell manufacturing
-
Osaka, Japan
-
Schneiderlochner E, Grohe A, Glunz SW, Preu R, Willeke W. Scanning Nd: YAG laser system for industrially applicable processing in silicon solar cell manufacturing. In 3rd WCPEC, Osaka, Japan, 2003; 1364-1367.
-
(2003)
3rd WCPEC
, pp. 1364-1367
-
-
Schneiderlochner, E.1
Grohe, A.2
Glunz, S.W.3
Preu, R.4
Willeke, W.5
-
5
-
-
35448932584
-
Innovative and efficient production process for silicon solar cells and modules-SOLPRO IV
-
Paris
-
Preu R, Emanuel G, Untiedt D, Klappert S, Schmidhuber H, Biro D, Voyer C, Wolke W, Schneiderlochner E. Innovative and efficient production process for silicon solar cells and modules-SOLPRO IV. In 19th EPVSEC, Paris, 2004; 978-981.
-
(2004)
19th EPVSEC
, pp. 978-981
-
-
Preu, R.1
Emanuel, G.2
Untiedt, D.3
Klappert, S.4
Schmidhuber, H.5
Biro, D.6
Voyer, C.7
Wolke, W.8
Schneiderlochner, E.9
-
6
-
-
0025385903
-
Excimer laser junction isolation of crystalline silicon solar cells
-
Micheels RH, Valdivia PE. Excimer laser junction isolation of crystalline silicon solar cells. IEEE Transactions on Electron Devices 1990; 37(2): 353-354.
-
(1990)
IEEE Transactions on Electron Devices
, vol.37
, Issue.2
, pp. 353-354
-
-
Micheels, R.H.1
Valdivia, P.E.2
-
7
-
-
35448975367
-
Fast cutting and scribing of silicon PV cells using the water-jet-guided laser technology
-
Dresden, Germany
-
Perrottet D, Housh R, Richerzhagen B. Fast cutting and scribing of silicon PV cells using the water-jet-guided laser technology. In 21st EPVSEC, Dresden, Germany, 2006, 811-814.
-
(2006)
21st EPVSEC
, pp. 811-814
-
-
Perrottet, D.1
Housh, R.2
Richerzhagen, B.3
-
8
-
-
27944449740
-
One shot mapping of minority carrier diffusion length in polycrystalline Si solar cells using electroluminescence
-
Orlando, USA
-
Fuyuki T, Kondo H, Kaji Y, Yamazaki T, Takahashi Y, Uraoka Y. One shot mapping of minority carrier diffusion length in polycrystalline Si solar cells using electroluminescence. In 31st IEEE PVSC, Orlando, USA, 2005.
-
(2005)
31st IEEE PVSC
-
-
Fuyuki, T.1
Kondo, H.2
Kaji, Y.3
Yamazaki, T.4
Takahashi, Y.5
Uraoka, Y.6
-
9
-
-
22144480285
-
Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence
-
Fuyuki T, Kondo H, Yamazaki T, Takahashi Y, Uraoka Y. Photographic surveying of minority carrier diffusion length in polycrystalline silicon solar cells by electroluminescence. Applied Physics Letters 2005; 86(26): 262108.
-
(2005)
Applied Physics Letters
, vol.86
, Issue.26
, pp. 262108
-
-
Fuyuki, T.1
Kondo, H.2
Yamazaki, T.3
Takahashi, Y.4
Uraoka, Y.5
-
11
-
-
41749115158
-
Fast photoluminescence imaging of silicon wafers
-
Hawaii, USA
-
Trupke T, Bardos RA, Abbott MD, Chen FW, Cotter JE, Lorenz A. Fast photoluminescence imaging of silicon wafers. In 4th WCPVSEC, Hawaii, USA, 2006.
-
(2006)
4th WCPVSEC
-
-
Trupke, T.1
Bardos, R.A.2
Abbott, M.D.3
Chen, F.W.4
Cotter, J.E.5
Lorenz, A.6
-
12
-
-
41749085494
-
Application of photoluminescence to high-efficiency silicon solar cell fabrication
-
Hawaii, USA
-
Abbott MD, Cotter JE, Trupke T, Fischer K, Bardos RA. Application of photoluminescence to high-efficiency silicon solar cell fabrication. In 4th WCPVSEC, Hawaii, USA, 2006.
-
(2006)
4th WCPVSEC
-
-
Abbott, M.D.1
Cotter, J.E.2
Trupke, T.3
Fischer, K.4
Bardos, R.A.5
-
13
-
-
34247181185
-
Electroluminescence as an in-line characterisation tool for solar cell production
-
Dresden, Germany
-
Bothe K, Pohl P, Schmidt J, Weber T, Altermatt PP, Fischer B, Brendel R. Electroluminescence as an in-line characterisation tool for solar cell production. In 21st EPVSEC, Dresden, Germany, 2006.
-
(2006)
21st EPVSEC
-
-
Bothe, K.1
Pohl, P.2
Schmidt, J.3
Weber, T.4
Altermatt, P.P.5
Fischer, B.6
Brendel, R.7
-
14
-
-
41749117268
-
Luminoscopy - Novel tool for the diagnosis of crystalline silicon solar cells and modules utilizing electroluminescence
-
Hawaii, USA
-
Takahashi Y, Kaji Y, Ogane O, Uruoka Y, Fuyuki T. "Luminoscopy" - Novel tool for the diagnosis of crystalline silicon solar cells and modules utilizing electroluminescence. In WCPEC-4, Hawaii, USA, 2006.
-
(2006)
WCPEC-4
-
-
Takahashi, Y.1
Kaji, Y.2
Ogane, O.3
Uruoka, Y.4
Fuyuki, T.5
-
15
-
-
35448991437
-
Comparative analysis of n-type versus p-type string ribbon silicon wafers
-
Hawaii, USA
-
Bardos RA, Cotter JE, Trupke T, Lorenz A. Comparative analysis of n-type versus p-type string ribbon silicon wafers. In WCPEC-4, Hawaii, USA, 2006.
-
(2006)
WCPEC-4
-
-
Bardos, R.A.1
Cotter, J.E.2
Trupke, T.3
Lorenz, A.4
-
16
-
-
33847641339
-
Spatially resolved series resistance of silicon solar cells obtained from luminescence imaging
-
Trupke T, Pink E, Bardos RA, Abbott MD. Spatially resolved series resistance of silicon solar cells obtained from luminescence imaging. Applied Physics Letters 2007; 90: 093506.
-
(2007)
Applied Physics Letters
, vol.90
, pp. 093506
-
-
Trupke, T.1
Pink, E.2
Bardos, R.A.3
Abbott, M.D.4
-
17
-
-
0005051985
-
The imaging of shunts in solar cells by infrared lock-in thermography
-
Munich
-
Breitenstein O, Langenkamp M, Rakotoniaina JP, Zettner J. The imaging of shunts in solar cells by infrared lock-in thermography. In 17th EPVSC, Munich, 2001, 1499-1502.
-
(2001)
17th EPVSC
, pp. 1499-1502
-
-
Breitenstein, O.1
Langenkamp, M.2
Rakotoniaina, J.P.3
Zettner, J.4
-
18
-
-
35448996697
-
Luminescence imaging: An ideal characterisation tool for silicon
-
Denver
-
Trupke T, Bardos RA, Abbott MD, Chen FW, Fisher K, Cotter JE. Luminescence imaging: an ideal characterisation tool for silicon. In 16th Crystalline Silicon Workshop, Denver, 2006.
-
(2006)
16th Crystalline Silicon Workshop
-
-
Trupke, T.1
Bardos, R.A.2
Abbott, M.D.3
Chen, F.W.4
Fisher, K.5
Cotter, J.E.6
-
19
-
-
35448980105
-
Luminescence imaging for fast shunt localisation in silicon solar cells and silicon wafers
-
Sendai, Japan
-
Trupke T, Bardos RA, Abbott MD, Fisher K, Bauer J, Breitenstein O. Luminescence imaging for fast shunt localisation in silicon solar cells and silicon wafers. In International Workshop on Science and Technology of Crystalline Silicon Solar Cells, Sendai, Japan, 2006.
-
(2006)
International Workshop on Science and Technology of Crystalline Silicon Solar Cells
-
-
Trupke, T.1
Bardos, R.A.2
Abbott, M.D.3
Fisher, K.4
Bauer, J.5
Breitenstein, O.6
-
20
-
-
33751563307
-
-
Kasemann M, Schubert MC, The M, Köber M, Hermle M, Warta W. Comparison of luminescence imaging and illuminated lock-in thermography on silicon solar cells. Applied Physics Letters 2006; 89: 224102.
-
Kasemann M, Schubert MC, The M, Köber M, Hermle M, Warta W. Comparison of luminescence imaging and illuminated lock-in thermography on silicon solar cells. Applied Physics Letters 2006; 89: 224102.
-
-
-
-
21
-
-
10044273691
-
Verification of a generalized Planck law for luminescence radiation from silicon solar cells
-
Schick K, Daub E, Finkbeiner S, Würfel P. Verification of a generalized Planck law for luminescence radiation from silicon solar cells. Applied Physics A: Solids and Surfaces 1992; A54(2): 109-114.
-
(1992)
Applied Physics A: Solids and Surfaces
, vol.A54
, Issue.2
, pp. 109-114
-
-
Schick, K.1
Daub, E.2
Finkbeiner, S.3
Würfel, P.4
-
22
-
-
24644454883
-
Suns-photoluminescence: Contactless determination of the current voltage characteristics of silicon wafers
-
Trupke T, Bardos RA, Abbott MD, Cotter JE. Suns-photoluminescence: contactless determination of the current voltage characteristics of silicon wafers. Applied Physics Letters 2005; 87: 093503.
-
(2005)
Applied Physics Letters
, vol.87
, pp. 093503
-
-
Trupke, T.1
Bardos, R.A.2
Abbott, M.D.3
Cotter, J.E.4
-
23
-
-
35448980105
-
Luminescence imaging for fast shunt localisation in silicon solar cells and silicon wafers
-
Sendai, Japan, 2-3 October
-
Trupke T, Bardos RA, Abbott MD, Fisher K, Bauer J, Breitenstein O. Luminescence imaging for fast shunt localisation in silicon solar cells and silicon wafers. International Workshop on Science and Technology of Crystalline Silicon Solar Cells, Sendai, Japan, 2-3 October, 2006.
-
(2006)
International Workshop on Science and Technology of Crystalline Silicon Solar Cells
-
-
Trupke, T.1
Bardos, R.A.2
Abbott, M.D.3
Fisher, K.4
Bauer, J.5
Breitenstein, O.6
-
24
-
-
0000987816
-
A Quasi-Steady-State open-circuit voltage method for solar cell characterization
-
Glasgow, UK
-
Sinton RA, Cuevas A. A Quasi-Steady-State open-circuit voltage method for solar cell characterization. In 16th EPVSEC, Glasgow, UK, 2000, 1152-1155.
-
(2000)
16th EPVSEC
, pp. 1152-1155
-
-
Sinton, R.A.1
Cuevas, A.2
-
25
-
-
35448980534
-
Novel technique for low-damage microstructuring of silicon
-
Barcelona
-
Kray D, Baumann S, Mayer K, Eyer A, Willeke GP. Novel technique for low-damage microstructuring of silicon. In 20th EPVSEC, Barcelona, 2005.
-
(2005)
20th EPVSEC
-
-
Kray, D.1
Baumann, S.2
Mayer, K.3
Eyer, A.4
Willeke, G.P.5
|