Raman scattering studies of heavily doped microcrystalline porous silicon and porous silicon free-standing membranes

Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 7, 2010, Pages

  Abidi, Dorra ^a,b   Jusserand, Bernard ^a   Fave, Jean Louis ^a  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

^b UNIVERSITY OF TUNIS   (Tunisia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957575828     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.075210     Document Type: Article

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