Structure and correlations in porous silicon studied by x-ray scattering methods

Solid State Communications

Volumn 100, Issue 1, 1996, Pages 13-16

  Binder, M ^a   Edelmann, T ^a   Metzger, T H ^a   Peisl, J ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

A. semiconductors; B. X ray scattering; C. crystal structure and symmetry

Indexed keywords

APPROXIMATION THEORY; CRYSTAL ATOMIC STRUCTURE; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTROMAGNETIC WAVE SCATTERING; EMISSION SPECTROSCOPY; MATHEMATICAL MODELS; MORPHOLOGY; OPTICAL PROPERTIES; PARTICLE SIZE ANALYSIS; PHOTOLUMINESCENCE; SYNCHROTRON RADIATION;

BLUE SHIFT; GRAZING INCIDENCE DIFFRACTION; PHOTOLUMINESCENCE SPECTRA; SMALL ANGLE X RAY SCATTERING;

POROUS SILICON;

EID: 0030269694     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1098(96)00376-6     Document Type: Article

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