Surface and optical characterization of the porous silicon textured surface

Journal of Materials Science: Materials in Electronics

Volumn 16, Issue 1, 2005, Pages 1-6

  Vinod, P N ^a   Lal, M ^b  

^a NAVAL PHYSICAL AND OCEANOGRAPHIC LABORATORY   (India)

^b NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ETCHING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MORPHOLOGY; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; POROSITY; RAMAN SCATTERING; REFRACTIVE INDEX; SURFACE STRUCTURE; TEXTURES;

DIFFUSED REFLECTANCE; ELECTROCHEMICALLY ETCHED LAYERS; FORMATION CONDITIONS; POROUS SILICON TEXTURED SURFACE;

POROUS SILICON;

EID: 13944284491     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10854-005-4949-6     Document Type: Article

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