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Volumn 82, Issue 11, 2010, Pages

Raman efficiency in SiGe alloys

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EID: 77957565856     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.115317     Document Type: Article
Times cited : (27)

References (25)
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    • 48249136997 scopus 로고    scopus 로고
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    • 0003667047 scopus 로고
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    • Cardona, M.1    Guntherodt, G.2
  • 23
    • 0032003725 scopus 로고    scopus 로고
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    • H. Lee, Thin Solid Films 313-314, 167 (1998). 10.1016/S0040-6090(97) 00805-5
    • (1998) Thin Solid Films , vol.313-314 , pp. 167
    • Lee, H.1
  • 25
    • 0042098720 scopus 로고
    • 10.1103/PhysRev.185.1103
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    • Sell, D.D.1    Kane, E.O.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.