Raman spectroscopy of Si1-xGex epilayers;Erratum to "Raman spectroscopy of Si1-xGex epilayers" [Mater. Sci. Eng. B 124-125 (2005) 127-131] (DOI:10.1016/j.mseb.2005.08.057)

Materials Science and Engineering: B

Volumn 137, Issue 1-3, 2007, Pages 315-

  Pezzoli, F ^a   Martinelli, Lucio ^a   Grilli, E ^a   Guzzi, M ^a   Sanguinetti, S ^a   Bollani, M ^a   Chrastina, H D ^b   Isella, G ^b   von Kanel H ^b   Wintersberger, E ^c   Stangl, J ^c   Bauer, G ^c  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b POLITECNICO DI MILANO   (Italy)

^c JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

Si1 xGex epilayers; Raman spectroscopy; Vibrational properties

Indexed keywords

EID: 33846828445     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2005.08.057     Document Type: Conference Paper

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