Use of the atomic force microscope to determine the strength of bacterial attachment to grooved surface features

Journal of Adhesion Science and Technology

Volumn 24, Issue 13-14, 2010, Pages 2271-2285

  Verran, J ^a   Packer, A ^a   Kelly, P J ^a   Whitehead, K A ^a  

^a MANCHESTER METROPOLITAN UNIVERSITY   (United Kingdom)

Author keywords

Atomic Force Microscopy (AFM); bacteria; force; grooved structures; roughness; surface topography; titanium

Indexed keywords

AFM TIP; APPLIED FORCES; ATOMIC FORCE MICROSCOPES; BACTERIAL ATTACHMENT; DEEP GROOVE; E. COLI; FOOD CONTACT; FORCE; GROOVED STRUCTURES; GROOVED SURFACES; IN-CELL; LATERAL FORCE; LINEAR FEATURE; PHYSICAL VAPOUR DEPOSITION; ROD-SHAPED BACTERIA; ROUGHNESS; SURFACE FEATURE; TOPOGRAPHIC FEATURES; TOPOGRAPHICAL FEATURES;

ATOMIC FORCE MICROSCOPY; ATOMS; BACTERIA; BACTERIOLOGY; ESCHERICHIA COLI; METAL COATINGS; TITANIUM; TOPOGRAPHY;

SURFACE ROUGHNESS;

EID: 77957557097     PISSN: 01694243     EISSN: 15685616     Source Type: Journal    
DOI: 10.1163/016942410X508019     Document Type: Article

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