The production of surfaces of defined topography and chemistry for microbial retention studies, using ion beam sputtering technology

International Biodeterioration and Biodegradation

Volumn 54, Issue 2-3, 2004, Pages 143-151

  Whitehead, K A ^a   Colligon, J S ^a   Verran, J ^a  

^a MANCHESTER METROPOLITAN UNIVERSITY   (United Kingdom)

Author keywords

Microbial adhesion; Microbial retention; Surface engineering; Surface roughness; Surface topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; ION BEAMS; MICROORGANISMS; SPUTTERING; SURFACE ROUGHNESS; THIN FILMS;

ION BEAM SPUTTERING TECHNOLOGY; TOPOGRAPHY;

BIODEGRADATION;

MICROBIOLOGY; MICROORGANISM; SURFACE ROUGHNESS; TITANIUM;

EID: 4344565191     PISSN: 09648305     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ibiod.2004.03.010     Document Type: Conference Paper

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