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Volumn 81, Issue 7, 2010, Pages

A simple hard x-ray "nanoslit" for measuring wavefront intensity

Author keywords

[No Author keywords available]

Indexed keywords

FRESNEL; HARD X RAY; HIGH SPATIAL RESOLUTION; INTENSITY DISTRIBUTION; METAL WIRES; NANO SCALE; NANO-SCALE APERTURE; NANOSLITS; PLATINUM WIRE; RECTANGULAR APERTURE; SINGLE SLIT; WAVE-FRONT INTENSITY; X RAY BEAM;

EID: 77957161057     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3456447     Document Type: Article
Times cited : (3)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.