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Frontiers of Physics in China

Volumn 5, Issue 4, 2010, Pages 405-413

In situ characterization of optoelectronic nanostructures and nanodevices

(5) Gao, Min a Li, Cheng yao a Li, Wen liang a Zhang, Xiao xian a Peng, Lian mao a

a PEKING UNIVERSITY (China)

Author keywords

deep level emission; in situ electron microscopy; one dimensional (1 D) semiconductor nanostructure; optical confinement; optoelectronic nanodevices

Indexed keywords

EID: 77957019358 PISSN: 16733487 EISSN: 16733606 Source Type: Journal
DOI: 10.1007/s11467-010-0131-6 Document Type: Review

Times cited : (4)

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