Growth characteristics and surface roughening of vapor-deposited MgO thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 4, 1999, Pages 2839-2843

  Yoon, Jong Gul ^a   Oh, Hun Kyoo ^a   Lee, Sung Jong ^a  

^a Suwon University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001659409     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.2839     Document Type: Article

References (29)

1. F. C. Frank and J. H. van der Merwe, Proc. R. Soc. London, Ser. A, 198, 205 (1949).
2. M. Volmer and A. Weber, Z. Phys. Chem., 119, 277 (1926).
3. I. N. Stranski and L. von Krastanov, Akad. Wiss. Lit. Mainz Abh. Math. Naturwiss. K1., 146, 797 (1939).
4. E. Bauer and J. H. van der Merwe, Phys. Rev. B, 33, 3657 (1986).
5. F. Family and T. Vicsek, J. Phys. A, 18, L75 (1985).
6. F. Family and T. Vicsek (World Scientific, Singapore, 1991).
7. A. L. Barabasi and H. E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, Cambridge, 1995).
8. J. Krug, Adv. Phys., 46, 139 (1997).
9. D. K. Fork, F. A. Ponce, J. C. Tramontana, and T. H. Gaballe, Appl. Phys. Lett., 58, 2294 (1991).
10. D. K. Fork and G. B. Anderson, Appl. Phys. Lett., 63, 1029 (1993).
11. J.-G. Yoon and K. Kim, Appl. Phys. Lett., 68, 2523 (1996).
12. E. E. Fullerton, D. M. Kelly, J. Guimpel, I. K. Schuller, and Y. Bruynseraede, Phys. Rev. Lett., 68, 859 (1992).
13. J. Barnas and Y. Bruynseraede, Phys. Rev. B, 53, 5449 (1996).
14. S. Yadavalli, M. H. Yang, and C. P. Flynn, Phys. Rev. B, 41, 7961 (1990).
15. B. S. Kwak, E. P. Boyd, K. Zhang, and A. Erbil, Appl. Phys. Lett., 54, 2542 (1989).
16. J.-G. Yoon and K. Kim, Appl. Phys. Lett., 66, 2661 (1995).
17. J.-G. Yoon, Y. J. Kwag, and H. K. Kim, J. Korean Phys. Soc., 3, 613 (1997).
18. E. J. Tarsa, X. H. Wu, J. P. Ibbetson, J. S. Speck, and J. J. Zinck, Appl. Phys. Lett., 66, 3588 (1995).
19. C. P. Wang, K. B. Do, M. R. Beasley, T. H. Geballe, and R. H. Hammond, Appl. Phys. Lett., 71, 2955 (1997).
20. M. H. Yang and C. P. Flynn, Phys. Rev. Lett., 62, 2476 (1989).
21. J. G. Amar and F. Family, in Mechanism of Thin Film Evolution, edited by S. M. Yalisove, C. P. Thomson, and D. J. Eaglesham, MRS Symposia Proceedings No. 317 (Materials Research Society, Pittsburgh, 1994).
22. W. M. Tong, R. S. Williams, A. Yanase, Y. Segawa, and M. S. Anderson, Phys. Rev. Lett., 72, 3374 (1994).
23. J. H. Jeffries, J.-K. Zuo, and M. M. Craig, Phys. Rev. Lett., 76, 4931 (1996).
24. R. C. Salvarezza, L. Vázquez, P. Herrasti, P. Ocón, J. M. Vara, and A. J. Arvia, Europhys. Lett., 20, 727 (1992).
25. L. Vázquez, J. M. Albella, R. C. Salvarezza, A. J. Arvia, R. A. Levy, and D. Perese, Appl. Phys. Lett., 68, 1285 (1996).
26. G. W. Collins, S. A. Letts, E. M. Fearon, R. L. McEachern, and T. P. Bernat, Phys. Rev. Lett., 73, 708 (1994).
27. Z.-W. Lai and Das Sarma, Phys. Rev. Lett., 66, 2348 (1991).
28. D. E. Wolf and J. Villain, Europhys. Lett., 13, 389 (1990).
29. M. Siegert and M. Plischke, Phys. Rev. Lett., 73, 1517 (1994).