Nanoscale measurements of local junction breakdown in epitaxial film silicon solar cells

Applied Physics Letters

Volumn 97, Issue 9, 2010, Pages

  Romero, M J ^a   Alberi, K ^a   Martin, I T ^a   Jones, K M ^a   Young, D L ^a   Yan, Y ^a   Teplin, C ^a   Al Jassim, M M ^a   Stradins, P ^a   Branz, H M ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE BREAKDOWN; AVALANCHE MULTIPLICATION; BREAKDOWN VOLTAGE; DEFECT STATE; ELECTROSTATIC FIELD; NANO-SCALE MEASUREMENTS;

DEFECTS; EPITAXIAL FILMS; HETEROJUNCTION BIPOLAR TRANSISTORS; SEMICONDUCTING SILICON COMPOUNDS; SILICON SOLAR CELLS; SOLAR CELLS; TRANSMISSION ELECTRON MICROSCOPY;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 77956390634     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3479534     Document Type: Article

References (18)

1. R. B. Bergmann, Appl. Phys. A: Mater. Sci. Process. APAMFC 0947-8396 69, 187 (1999). 10.1007/s003390050989
2. K. R. Catchpole, M. J. McCann, K. J. Weber, and A. W. Blakers, Sol. Energy Mater. Sol. Cells SEMCEQ 0927-0248 68, 173 (2001). 10.1016/S0927-0248(00) 00246-4
3. A. G. Aberle, Thin Solid Films THSFAP 0040-6090 511-512, 26 (2006). 10.1016/j.tsf.2005.12.070
4. H. Comfort, L. M. Garverick, and R. Reif, J. Appl. Phys. JAPIAU 0021-8979 62, 3388 (1987) 10.1063/1.339301;
5. Y. Mori, K. Yoshii, K. Yasutake, H. Kakiuchi, H. Ohmi, and K. Wada, Thin Solid Films THSFAP 0040-6090 444, 138 (2003). 10.1016/S0040-6090(03)01148-9
6. B. Rau, I. Sieber, B. Selle, S. Brehme, U. Knipper, S. Gall, and W. Fuhs, Thin Solid Films THSFAP 0040-6090 451-452, 644 (2004). 10.1016/j.tsf.2003.11. 058
7. A. G. Aberle, A. Straub, P. I. Widenborg, A. B. Sproul, Y. Huang, and P. Campbell, Prog. Photovoltaics PPHOED 1062-7995 13, 37 (2005). 10.1002/pip.577
8. M. L. Terry, A. Straub, D. Inns, D. Song, and A. G. Aberle, Appl. Phys. Lett. APPLAB 0003-6951 86, 172108 (2005). 10.1063/1.1921352
9. P. I. Widenborg and A. G. Aberle, J. Cryst. Growth JCRGAE 0022-0248 306, 177 (2007). 10.1016/j.jcrysgro.2007.03.053
10. I. T. Martin, C. W. Teplin, J. R. Doyle, H. M. Branz, and P. Stradins, J. Appl. Phys. JAPIAU 0021-8979 107, 054906 (2010). 10.1063/1.3298455
11. C. W. Teplin, K. Alberi, M. Shub, C. Beall, I. Martin, M. J. Romero, D. L. Young, R. C. Reedy, P. Stradins, and H. M. Branz, Appl. Phys. Lett. APPLAB 0003-6951 96, 201901 (2010). 10.1063/1.3422474
12. K. Alberi, I. T. Martin, M. Shub, C. W. Teplin, M. J. Romero, R. C. Reedy, E. Iwaniczko, A. Duda, P. Stradins, H. M. Branz, and D. L. Young, Appl. Phys. Lett. APPLAB 0003-6951 96, 073502 (2010). 10.1063/1.3309751
13. M. Kasemann, W. Kwapil, M. C. Schubert, H. Habenicht, B. Walter, M. The, S. Kontermann, S. Rein, O. Breitenstein, J. Bauer, A. Lotnyk, B. Michl, H. Nagel, A. Schütt, J. Carstensen, H. Föll, T. Trupke, Y. Augarten, H. Kampwerth, R. A. Bardos, S. Pingel, J. Berghold, W. Warta, and S. W. Glunz, Proceedings of the 33rd IEEE Photovoltaic Specialists Conference (IEEE, San Diego CA, May 11-16, 2008), p. 148.
14. W. Kwapil, M. Kasemann, P. Gundel, M. C. Schubert, W. Warta, O. Breitenstein, J. Bauer, A. Lotnyk, J. -M. Wagner, G. Coletti, and P. C. P. Bronsveld, Proceedings of the 24th European Photovoltaic Solar Energy Conference and Exhibition (WIP, Hamburg, Germany, September 21-25, 2009), p. 896.
15. A. L. Lacaita, F. Zappa, S. Bigliardi, and M. Manfredi, IEEE Trans. Electron Devices IETDAI 0018-9383 40, 577 (1993). 10.1109/16.199363
16. N. Akil, S. E. Kerns, D. V. Kerns, Jr., A. Hoffmann, and J. -P. Charles, Appl. Phys. Lett. APPLAB 0003-6951 73, 871 (1998). 10.1063/1.121971
17. We observe a blueshift in the emission spectrum of the overall radiation emitted by the junction breakdown site when increasing the applied reverse bias.
18. S. M. Sze and G. Gibbons, Solid-State Electron. SSELA5 0038-1101 9, 831 (1966). 10.1016/0038-1101(66)90033-5