Drive frequency dependent phase imaging in piezoresponse force microscopy

Journal of Applied Physics

Volumn 108, Issue 4, 2010, Pages

  Bo, Huifeng ^a   Kan, Yi ^a   Lu, Xiaomei ^a   Liu, Yunfei ^a   Peng, Song ^a   Wang, Xiaofei ^a   Cai, Wei ^a   Xue, Ruoshi ^a   Zhu, Jinsong ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT RESONANCE; EIGEN MODES; ELECTROMECHANICAL INTERACTIONS; ELECTROSTATIC INTERACTIONS; FREQUENCY DEPENDENT; FREQUENCY SHIFT; MODULATION AMPLITUDES; MODULATION VOLTAGE; NEAR-STOICHIOMETRIC LITHIUM NIOBATE; NONLOCAL; PHASE DIFFERENCE; PHASE IMAGING; PHASE IMAGING TECHNIQUES; PHASE SIGNALS; PIEZORESPONSE; PIEZORESPONSE FORCE MICROSCOPY; SAMPLE SYSTEM;

IMAGING TECHNIQUES; LITHIUM; NIOBIUM COMPOUNDS; SCANNING PROBE MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS;

ELECTROSTATIC FORCE;

EID: 77956305367     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3474956     Document Type: Conference Paper

References (23)

1. A. Gruverman and A. Kholkin, Rep. Prog. Phys. RPPHAG 0034-4885 69, 2443 (2006). 10.1088/0034-4885/69/8/R04
2. S. V. Kalinin, A. Rar, and S. Jesse, IEEE Trans. Ultrason. Ferroelectr. Freq. Control ITUCER 0885-3010 53, 2226 (2006). 10.1109/TUFFC.2006.169
3. A. Gruverman and S. V. Kalinin, J. Mater. Sci. JMTSAS 0022-2461 41, 107 (2006). 10.1007/s10853-005-5946-0
4. A. Hoffman, T. Jungk, and E. Soergel, Rev. Sci. Instrum. RSINAK 0034-6748 78, 016101 (2007). 10.1063/1.2424448
5. C. D. Onal, B. Sumer, and M. Sitti, Rev. Sci. Instrum. RSINAK 0034-6748 79, 103706 (2008). 10.1063/1.3002483
6. V. V. Shvartsman, N. A. Pertsev, J. M. Herrero, C. Zaldo, and A. L. Kholkin, J. Appl. Phys. JAPIAU 0021-8979 97, 104105 (2005). 10.1063/1.1891273
7. T. Jungk, A. Hoffmann, and E. Soergel, Appl. Phys. Lett. APPLAB 0003-6951 89, 163507 (2006). 10.1063/1.2362984
8. B. J. Rodriguez, A. Gruverman, A. I. Kingon, R. J. Nemanich, and O. Ambacher, Appl. Phys. Lett. APPLAB 0003-6951 80, 4166 (2002). 10.1063/1.1483117
9. S. V. Kalinin, B. J. Rodriguez, S. Jesse, T. Thundat, and A. Gruverman, Appl. Phys. Lett. APPLAB 0003-6951 87, 053901 (2005). 10.1063/1.2006984
10. C. Harnagea, M. Alexe, D. Hesse, and A. Pignolet, Appl. Phys. Lett. APPLAB 0003-6951 83, 338 (2003). 10.1063/1.1592307
11. S. Jesse, B. Mirman, and S. V. Kalinin, Appl. Phys. Lett. APPLAB 0003-6951 89, 022906 (2006). 10.1063/1.2221496
12. B. J. Rodriguez, C. Callahan, S. V. Kalinin, and R. Proksch, Nanotechnology NNOTER 0957-4484 18, 475504 (2007). 10.1088/0957-4484/18/47/ 475504
13. S. Jesse, S. V. Kalinin, R. Proksch, A. P. Baddorf, and B. J. Rodriguez, Nanotechnology NNOTER 0957-4484 18, 435503 (2007). 10.1088/0957-4484/18/43/ 435503
14. K. Seal, S. Jesse, B. J. Rodriguez, A. P. Baddorf, and S. V. Kalinin, Appl. Phys. Lett. APPLAB 0003-6951 91, 232904 (2007). 10.1063/1.2814971
15. A. Morelli, G. Palasantzas, and J. T. M. De Hosson, J. Appl. Phys. JAPIAU 0021-8979 103, 114109 (2008). 10.1063/1.2939266
16. D. A. Scrymgeour and V. Gopalan, Phys. Rev. B PLRBAQ 0556-2805 72, 024103 (2005). 10.1103/PhysRevB.72.024103
17. S. Jesse, A. P. Baddorf, and S. V. Kalinin, Nanotechnology NNOTER 0957-4484 17, 1615 (2006). 10.1088/0957-4484/17/6/014
18. S. Hong, J. Woo, H. Shin, J. U. Jeon, Y. E. Pak, E. L. Colla, N. Setter, E. Kim, and K. No, J. Appl. Phys. JAPIAU 0021-8979 89, 1377 (2001). 10.1063/1.1331654
19. F. Peter, K. Szot, R. Waser, B. Reichenberg, S. Tiedke, and J. Szade, Appl. Phys. Lett. APPLAB 0003-6951 85, 2896 (2004). 10.1063/1.1799241
20. X. Y. Liu, K. Kitamura, and K. Terabe, Appl. Phys. Lett. APPLAB 0003-6951 89, 132905 (2006). 10.1063/1.2358115
21. U. Rabe, K. Janser, and W. Arnold, Rev. Sci. Instrum. RSINAK 0034-6748 67, 3281 (1996). 10.1063/1.1147409
22. S. V. Kalinin and D. A. Bonnell, Phys. Rev. B PLRBAQ 0556-2805 65, 125408 (2002). 10.1103/PhysRevB.65.125408
23. R. García and R. Ṕrez, Surf. Sci. Rep. SSREDI 0167-5729 47, 197 (2002). 10.1016/S0167-5729(02)00077-8