Piezoresponse force microscopy of ferroelectric thin films: Frequency dependence of phase imaging

Journal of Applied Physics

Volumn 103, Issue 11, 2008, Pages

  Morelli, A ^a   Palasantzas, G ^a   De Hosson, J Th M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; ELECTRONICS INDUSTRY; FERROELECTRIC THIN FILMS; FERROELECTRICITY; LEAD; MICROELECTRONICS; MICROSCOPES; RESONANCE; THICK FILMS; THIN FILMS; VAPOR DEPOSITION; ZIRCONIUM;

AC FIELDS; APPLIED (CO); FERROELECTRIC (BARIUM STRONTIUM TITANATE); FREQUENCY DEPENDENCES; NANOSCALE CHARACTERIZATION; PHASE DIFFERENCES; PHASE IMAGING; PIEZORESPONSE; PIEZORESPONSE FORCE MICROSCOPY (PFM); QUANTITATIVE MEASUREMENTS; RESONANCE FREQUENCIES;

FERROELECTRIC FILMS;

EID: 45149115642     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2939266     Document Type: Article

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