GISAXS characterization of order in hexagonal monolayers of FePt nanocrystals

Journal of Physical Chemistry C

Volumn 114, Issue 34, 2010, Pages 14427-14432

  Heitsch, Andrew T ^a   Patel, Reken N ^a   Goodfellow, Brian W ^a   Smilgies, Detlef M ^b   Korgel, Brian A ^a  

^a The University of Texas at Austin   (United States)

^b Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLOSE-PACKED MONOLAYERS; FEPT-NANOCRYSTALS; GI-SAXS; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; LANGMUIR-BLODGETT; LANGMUIRS; NANOCRYSTAL FILMS; SEM; SILICON SUBSTRATES; SUPER-LATTICE FILMS;

MONOLAYERS; SCANNING ELECTRON MICROSCOPY; X RAY SCATTERING;

NANOCRYSTALS;

EID: 77956137330     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp1047979     Document Type: Article

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