Photoluminescence studies on structural defects and room temperature ferromagnetism in Ni and Ni-H doped ZnO nanoparticles

Journal of Applied Physics

Volumn 108, Issue 2, 2010, Pages

  Tong, Liu Niu ^a   Cheng, Teng ^a   Han, Huai Bin ^a   Hu, Jin Lian ^a   He, Xian Mei ^a   Tong, Yan ^a   Schneider, Claus M ^b  

^a ANHUI UNIVERSITY OF TECHNOLOGY   (China)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BLUE SHIFT; COERCIVITIES; DIFFUSE REFLECTANCE SPECTRUM; DILUTED MAGNETIC SEMICONDUCTORS; DOPED ZNO; ELECTRON CONCENTRATION; GREEN EMISSIONS; HOST LATTICE; MAGNETIZATION MEASUREMENTS; NI-DOPED; PHOTOLUMINESCENCE PROPERTIES; PL MEASUREMENTS; ROOM TEMPERATURE FERROMAGNETISM; SAMPLE QUALITY; SECONDARY PHASE; SHALLOW DONORS; SOL-GEL METHODS; STRUCTURAL DEFECT; UV EMISSIONS; WURTZITES; X RAY PHOTOELECTRON SPECTRA; X-RAY DIFFRACTION DATA; ZNO;

ANNEALING; CARRIER CONCENTRATION; CONCENTRATION (PROCESS); CRYSTAL STRUCTURE; ELECTRON MOBILITY; FERROMAGNETISM; GELS; LATTICE CONSTANTS; MAGNETIC SEMICONDUCTORS; METAL ANALYSIS; NANOPARTICLES; PHOTOLUMINESCENCE; SEMICONDUCTOR DOPING; SOL-GEL PROCESS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZINC OXIDE; ZINC SULFIDE;

SATURATION MAGNETIZATION;

EID: 77955836986     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3460644     Document Type: Article

References (47)

1. J. M. D. Coey, M. Venkatesan, and C. B. Fitzgerald, Nature Mater. NMAACR 1476-1122 4, 173 (2005). 10.1038/nmat1310
2. S. A. Wolf, D. D. Awschalon, R. A. Buhrman, J. M. Daughton, S. Von Molnar, M. L. Roukes, A. Y. Chtchelkanova, and D. M. Treger, Science SCIEAS 0036-8075 294, 1488 (2001). 10.1126/science.1065389
3. T. Dietl, H. Ohno, and F. Matsukura, Science SCIEAS 0036-8075 287, 1019 (2000). 10.1126/science.287.5455.1019
4. S. Kolesnik, B. Dabrowski, and J. Mais, J. Appl. Phys. JAPIAU 0021-8979 95, 2582 (2004). 10.1063/1.1644638
5. D. -L. Hou, X. -J. Ye, H. -J. Meng, H. -J. Zhou, X. -L. Li, C. -M. Zhen, and G. -D. Tang, Appl. Phys. Lett. APPLAB 0003-6951 90, 142502 (2007). 10.1063/1.2719034
6. Y. Matsumoto, M. Murakami, T. Shono, T. Hasegawa, T. Fukumura, M. Kawasaki, P. Ahmet, T. Chikyow, K. Shin-ya, and H. Koinuma, Science SCIEAS 0036-8075 291, 854 (2001). 10.1126/science.1056186
7. K. Sato and H. Katayama-Yoshida, Jpn. J. Appl. Phys., Part 2 JAPLD8 0021-4922 39, L555 (2000) 10.1143/JJAP.39.L555; K. Sato and H. Katayama-Yoshida, Physica E (Amsterdam) PELNFM 1386-9477 10, 251 (2001). 10.1016/S1386-9477(01) 00093-5
8. R. G. Hernández, W. L. Ṕrez, and M. J. A. Rodrguez, J. Magn. Magn. Mater. JMMMDC 0304-8853 321, 2547 (2009). 10.1016/j.jmmm.2009.03.037
9. M. Venkatesan, C. B. Fizgerald, J. G. Lunney, and J. M. D. Coey, Phys. Rev. Lett. PRLTAO 0031-9007 93, 177206 (2004). 10.1103/PhysRevLett.93.177206
10. X. X. Liu, F. T. Lin, L. L. Sun, W. J. Cheng, X. M. Ma, and W. Z. Shi, Appl. Phys. Lett. APPLAB 0003-6951 88, 062508 (2006). 10.1063/1.2170420
11. P. V. Radovanovic and D. R. Gamelin, Phys. Rev. Lett. PRLTAO 0031-9007 91, 157202 (2003). 10.1103/PhysRevLett.91.157202
12. C. J. Cong, J. H. Hong, Q. Y. Liu, L. Liao, and K. L. Zhang, Solid State Commun. SSCOA4 0038-1098 138, 511 (2006). 10.1016/j.ssc.2006.04.020
13. W. Yu, L. H. Yang, X. Y. Teng, J. C. Zhang, Z. C. Zhang, L. Zhang, and G. S. Fu, J. Appl. Phys. JAPIAU 0021-8979 103, 093901 (2008). 10.1063/1.2903524
14. S. Thota, L. M. Kukreja, and J. Kumar, Thin Solid Films THSFAP 0040-6090 517, 750 (2008). 10.1016/j.tsf.2008.08.192
15. D. -L. Hou, R. -B. Zhao, Y. -Y. Wei, C. -M. Zhen, C. -F. Pan, and G. -D. Tang, Curr. Appl. Phys. ZZZZZZ 1567-1739 10, 124 (2010). 10.1016/j.cap.2009.05. 007
16. M. El-Hilo, A. A. Dakhel, and A. Y. Ali-Mohamed, J. Magn. Magn. Mater. JMMMDC 0304-8853 321, 2279 (2009). 10.1016/j.jmmm.2009.01.040
17. T. Wakano, N. Fujimura, Y. Morinaga, N. Abe, A. Ashida, and T. Ito, Physica E (Amsterdam) PELNFM 1386-9477 10, 260 (2001). 10.1016/S1386-9477(01) 00095-9
18. Z. Yin, N. Chen, F. Yang, S. Song, C. Chai, J. Zhong, H. Qian, and K. Ibrahim, Solid State Commun. SSCOA4 0038-1098 135, 430 (2005). 10.1016/j.ssc.2005.05.024
19. S. K. Mandal, A. K. Das, T. K. Nath, and D. Karmakar, Appl. Phys. Lett. APPLAB 0003-6951 89, 144105 (2006). 10.1063/1.2360176
20. X. J. Liu, X. Y. Zhu, C. Song, F. Zeng, and F. Pan, J. Phys. D: Appl. Phys. JPAPBE 0022-3727 42, 035004 (2009). 10.1088/0022-3727/42/3/035004
21. X. Mao, W. Zhong, and Y. Du, J. Magn. Magn. Mater. JMMMDC 0304-8853 320, 1102 (2008). 10.1016/j.jmmm.2007.10.022
22. M. Snure, D. Kumar, and A. Tiwari, Appl. Phys. Lett. APPLAB 0003-6951 94, 012510 (2009). 10.1063/1.3067998
23. C. H. Park and D. J. Chadi, Phys. Rev. Lett. PRLTAO 0031-9007 94, 127204 (2005). 10.1103/PhysRevLett.94.127204
24. H. J. Lee, C. H. Park, S. Y. Jeong, K. J. Yee, C. R. Cho, M. H. Jung, and D. J. Chadi, Appl. Phys. Lett. APPLAB 0003-6951 88, 062504 (2006). 10.1063/1.2171789
25. S. Deka and P. A. Joy, Appl. Phys. Lett. APPLAB 0003-6951 89, 032508 (2006). 10.1063/1.2227642
26. H. S. Hsu, J. C. A. Huang, S. F. Chen, and C. P. Liu, Appl. Phys. Lett. APPLAB 0003-6951 90, 102506 (2007). 10.1063/1.2711763
27. Z. H. Wang, D. Y. Geng, S. Guo, W. J. Hu, and Z. D. Zhang, Appl. Phys. Lett. APPLAB 0003-6951 92, 242505 (2008). 10.1063/1.2948863
28. B. K. Roberts, A. B. Pakhomov, and K. M. Krishnan, J. Appl. Phys. JAPIAU 0021-8979 103, 07D133 (2008). 10.1063/1.2833843
29. S. H. Liu, H. S. Hsu, C. R. Lin, C. S. Lue, and J. C. A. Huang, Appl. Phys. Lett. APPLAB 0003-6951 90, 222505 (2007). 10.1063/1.2745642
30. C. Liu, S. H. Chang, T. W. Noh, M. Abouzaid, P. Ruterana, H. H. Lee, D. -W. Kim, and J. -S. Chung, Appl. Phys. Lett. APPLAB 0003-6951 90, 011906 (2007). 10.1063/1.2428489
31. L. Vegard, Z. Phys. ZEPYAA 0044-3328 5, 17 (1921). 10.1007/BF01349680
32. C. G. Van de Walle, Phys. Rev. Lett. PRLTAO 0031-9007 85, 1012 (2000). 10.1103/PhysRevLett.85.1012
33. H. Wang, Y. Chen, H. B. Wang, C. Zhang, F. J. Yang, J. X. Duan, C. P. Yang, Y. M. Xu, M. J. Zhou, and Q. Li, Appl. Phys. Lett. APPLAB 0003-6951 90, 052505 (2007). 10.1063/1.2435606
34. P. Gopal and N. A. Spaldin, Phys. Rev. B PRBMDO 0163-1829 74, 094418 (2006). 10.1103/PhysRevB.74.094418
35. J. T. Richardson, D. I. Yiagas, B. Turk, K. Forster, and M. V. Twigg, J. Appl. Phys. JAPIAU 0021-8979 70, 6977 (1991). 10.1063/1.349826
36. Z. Yan, Y. Ma, D. Wang, J. Wang, Z. Gao, L. Wang, P. Yu, and T. Song, Appl. Phys. Lett. APPLAB 0003-6951 92, 081911 (2008). 10.1063/1.2887906
37. B. X. Lin, Z. X. Fu, and Y. B. Jia, Appl. Phys. Lett. APPLAB 0003-6951 79, 943 (2001). 10.1063/1.1394173
38. Y. Sun, N. G. Ndifor-Angwafor, D. Jason Riley, and M. N. R. Ashfold, Chem. Phys. Lett. CHPLBC 0009-2614 431, 352 (2006). 10.1016/j.cplett.2006.09.100
39. H. S. Kang, G. H. Kim, S. H. Lim, H. W. Chang, J. H. Kim, and S. Y. Lee, Thin Solid Films THSFAP 0040-6090 516, 3147 (2008). 10.1016/j.tsf.2007.08.084
40. E. Burstein, Phys. Rev. PRVAAH 0096-8250 93, 632 (1954). 10.1103/PhysRev.93.632
41. T. S. Moss, Proc. Phys. Soc. London, Sect. B PPSBAP 0370-1301 67, 775 (1954). 10.1088/0370-1301/67/10/306
42. S. Suwanboon, P. Amornpitoksuk, A. Haidoux, and J. C. Tedenac, J. Alloys Compd. JALCEU 0925-8388 462, 335 (2008). 10.1016/j.jallcom.2007.08.048
43. T. Rattana, S. Suwanboon, P. Amornpitoksuk, A. Haidoux, and P. Limsuwan, J. Alloys Compd. JALCEU 0925-8388 480, 603 (2009). 10.1016/j.jallcom.2009.02.011
44. D. C. Look, J. W. Hemsky, and J. R. Sizelove, Phys. Rev. Lett. PRLTAO 0031-9007 82, 2552 (1999). 10.1103/PhysRevLett.82.2552
45. F. K. Shan, G. X. Liu, W. J. Lee, and B. C. Shin, J. Cryst. Growth JCRGAE 0022-0248 291, 328 (2006). 10.1016/j.jcrysgro.2006.03.036
46. S. Singh, N. Rama, and M. S. Ramachandra Rao, Appl. Phys. Lett. APPLAB 0003-6951 88, 222111 (2006). 10.1063/1.2208563
47. Y. M. Strzhemechny, H. L. Mosbacker, D. C. Look, D. C. Reynolds, C. W. Litton, N. Y. Garces, N. C. Giles, L. E. Halliburton, S. Niki, and L. J. Brillson, Appl. Phys. Lett. APPLAB 0003-6951 84, 2545 (2004). 10.1063/1.1695440