Relationship between ultraviolet emission and electron concentration of ZnO thin films

Thin Solid Films

Volumn 516, Issue 10, 2008, Pages 3147-3151

  Kang, Hong Seong ^a   Kim, Gun Hee ^a   Lim, Sung Hoon ^a   Chang, Hyun Woo ^a   Kim, Jong Hoon ^a   Lee, Sang Yeol ^b  

^a Yonsei University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

Electron concentration; Ultraviolet emission; ZnO

Indexed keywords

CONCENTRATION (PROCESS); ELECTRONS; ULTRAVIOLET RADIATION; ZINC OXIDE;

ELECTRON CONCENTRATION; ULTRAVIOLET EMISSION;

THIN FILMS;

EID: 39649091230     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.08.084     Document Type: Article

References (14)

1. Reynolds D.C., Look D.C., and Jogai B. Solid State Commun. 99 (1996) 873
2. Look D.C., Reynolds D.C., Litton C.W., Jones R.L., Eason D.B., and Cantwell G. Appl. Phys. Lett. 81 (2002) 1830
3. Kang H.S., Kang J.S., Kim J.W., and Lee S.Y. J. Appl. Phys. 95 (2004) 1246
4. Kim K.K., Kim H.S., Hwang D.K., Lim J.H., and Park S.J. Appl. Phys. Lett. 83 (2003) 63
5. Lee S.Y., Shim E.S., Kang H.S., Pang S.S., and Kang J.S. Thin Solid Films 473 (2005) 31
6. Ryu Y.R., Lee T.S., Leem J.H., and White H.W. Appl. Phys. Lett. 83 (2003) 4032
7. Azaroff L.V. Introduction to solids (1960), McGRAW-HILL BOOK COMPANY, INC. 371
8. Li D., Leung Y.H., Djurišiæ A.B., Liu Z.T., Xie M.H., Shi S.L., Xu S.J., and Chan W.K. Appl. Phys. Lett. 85 (2004) 1601
9. Studenikin S.A., Cocivera M., Kellner W., and Pascher H. J. Lumin. 91 (2000) 223
10. Strzhemechny Y.M., Mosbacker H.L., Look D.C., Reynolds D.C., Litton C.W., Garces N.Y., Giles N.C., Halliburton L.E., Niki S., and Brillson L.J. Appl. Phys. Lett. 84 (2004) 2545
11. Gutowski J., Presser N., and Broser I. Phys. Rev., B 38 (1988) 9746
12. Look D.C., Jones R.L., Sizelove J.R., Garces N.Y., Giles N.C., and Halliburton L.E. Phys. Status Solidi, A Appl. Res. 195 (2003) 171
13. Zhang B.P., Binh N.T., Segawa Y., Kashiwaba Y., and Haga K. Appl. Phys. Lett. 84 (2004) 586
14. Zhang B.P., Binh N.T., Segawa Y., Wakatsuki K., and Usami N. Appl. Phys. Lett. 83 (2003) 1635