Amorphous-to-crystalline phase transition of (InTe) x ( GeTe) thin films

Journal of Applied Physics

Volumn 108, Issue 2, 2010, Pages

  Song, Ki Ho ^a   Beak, Seung Cheol ^a   Lee, Hyun Yong ^a  

^a Chonnam National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM DIAMETERS; CRYSTALLINE PHASE TRANSITION; ELECTRICAL BEHAVIORS; FOUR-POINT PROBE; PHASE-CHANGE RANDOM ACCESS MEMORY; THERMAL STABILITY;

CRYSTALLIZATION; GERMANIUM; PHASE CHANGE MEMORY; PHASE TRANSITIONS; RANDOM ACCESS STORAGE; TELLURIUM COMPOUNDS; THERMODYNAMIC STABILITY; X RAY DIFFRACTION;

AMORPHOUS FILMS;

EID: 77955813604     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3457868     Document Type: Article

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