Characteristics of amorphous Ag0.1 (Ge2 Sb2 Te5) 0.9 thin film and its ultrafast crystallization

Journal of Applied Physics

Volumn 104, Issue 10, 2008, Pages

  Song, Ki Ho ^a   Kim, Sung Won ^a   Seo, Jae Hee ^a   Lee, Hyun Yong ^a  

^a Chonnam National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING; CRYSTALLINE MATERIALS; CRYSTALLIZATION; ELECTRIC RESISTANCE; LASER BEAMS; LASERS; NANOCRYSTALLINE ALLOYS; PULSE GENERATORS; PULSED LASER APPLICATIONS; SEMICONDUCTING GERMANIUM COMPOUNDS; SHEET RESISTANCE; SOLDERED JOINTS; THICK FILMS;

AMORPHOUS CHALCOGENIDES; AMORPHOUS STATES; ANNEALED FILMS; CRYSTALLINE PHASE TRANSFORMATIONS; CRYSTALLINE PHASIS; CRYSTALLINE STATES; CRYSTALLIZATION SPEEDS; CURRENT PULSES; DATA STORAGES; ELECTRON HOPPING; FILM SURFACES; FOCUSED LASER BEAMS; LOCAL HEATING; MATERIAL CHARACTERISTICS; NANO-SECONDS; OPTICAL ABSORPTIONS; POWERS (P); PROGRAMMING CURRENTS; PULSE DURATIONS; RESPONSE SIGNALS; SHORT LASERS; TIME SCALES; ULTRA FASTS;

SILVER;

EID: 57049171377     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3026720     Document Type: Article

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