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Journal of Analytical Atomic Spectrometry

Volumn 21, Issue 11, 2006, Pages 1136-1142

X-ray standing waves: A method for thin layered systems

(5) Krämer, Markus a Von Bohlen, Alex a Sternemann, Christian b Paulus, Michael b Hergenröder, Roland a

a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V (Germany)

b TU DORTMUND UNIVERSITY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FOURIER TRANSFORMS; MULTILAYERS; POLYSTYRENES; THICKNESS MEASUREMENT; THIN FILMS; X RAY SPECTROSCOPY;

COMPUTERIZED SIMULATION TOOLS; MULTILAYER THIN FILMS; POLYSTYRENE FILM; SILICON SUBSTRATES;

STANDING WAVE METERS;

EID: 33750429973 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/b607252f Document Type: Article

Times cited : (29)

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