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Volumn 81, Issue 17, 2010, Pages

Reversal of chloride-induced Cu(001) subsurface buckling in the electrochemical environment: An in situ surface x-ray diffraction and density functional theory study

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EID: 77955462292     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.81.174114     Document Type: Article
Times cited : (43)

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