Surface relaxation phenomena at electrified interfaces: Revealing adsorbate, potential, and solvent effects by combined x-ray diffraction, STM and DFT studies

Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 11, 2009, Pages

  Saracino, Martino ^a,b   Broekmann, Peter ^c,d   Gentz, Knud ^c   Becker, Moritz ^a   Keller, Hubert ^b   Janetzko, Florian ^c   Bredow, Thomas ^c   Wandelt, Klaus ^c   Dosch, Helmut ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

^c UNIVERSITY OF BONN   (Germany)

^d UNIVERSITY OF BERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65549135018     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.115448     Document Type: Article

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