Multilayer mirror as a substrate for total reflection X-ray fluorescence spectrometry

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 65, Issue 6, 2010, Pages 434-440

  Tiwari, M K ^a,b   Sawhney, K J S ^a   Lodha, G S ^b  

^a DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^b RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

Particulate matter and trace elements; Synchrotron radiation; X ray fluorescence; X ray standing wave

Indexed keywords

FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; LASER OPTICS; MIRRORS; MULTILAYERS; PARTICLE SIZE ANALYSIS; SYNCHROTRON RADIATION; TRACE ELEMENTS;

DETECTION SENSITIVITY; FLUORESCENCE EXCITATION; PARTICLES SIZE DISTRIBUTION; PARTICULATE MATTER; TOTAL EXTERNAL REFLECTION; TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRIES; X RAY FLUORESCENCE; X-RAY STANDING WAVES;

PARTICLES (PARTICULATE MATTER);

EID: 77955229408     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2010.02.011     Document Type: Conference Paper

References (30)

1. R. Klockenkamper, Total reflection X-ray fluorescence analysis, Wiley, New York, 1997, p. 35.
2. C. Streli, P. Wobrauschek, E. Unfried, H. Aiginger, A new spectrometer for total reflection X-ray fluorescence analysis of light elements, Nucl. Instr. Methods A 334 (1993) 425-429.
3. A. Prange, H. Schwenke, Trace element analysis using total reflection X-ray fluorescence spectrometry, Adv. X-ray Anal. 35 (1992) 899-923.
4. R. P. Stossel, A. Prange, Determination of trace elements in rainwater by totalreflection X-ray fluorescence, Anal. Chem. 57 (1985) 2880-2885.
5. A. von Bohlen, Total reflection X-ray fluorescence spectrometry - a versatile tool for ultra trace-micro analysis of objects of cultural heritage, e-PS, vol. 1, 2004, pp. 23-34.
6. M. J. Bedzyk, G. M. Bommarito, J. S. Schildkraut, X-ray standing waves at a reflecting mirror surface, Phys. Rev. Lett. 62 (1989) 1376-1379.
7. M. J. Bedzyk, D. H. Bilderback, G. M. Bommarito, M. Caffrey, J. S. Schildkraut, X-ray standing waves: a molecular Yardstick for biological membranes, Science 241 (4874) (1988) 1788-1791.
8. H. D. Abruña, G. M. Bommarito, D. Acevedo, The study of solid/liquid interfaces with X-ray standing waves, Science 250 (4977) (1990) 69-74.
9. N. N. Novikova, S. I. Zheludeva, N. D. Stepina, A. L. Tolstikhina, R. V. Gaynutdinov, W. Haase, A. I. Erko, A. A. Knyazev, Y. G. Galyametdinov, X-ray standing wave studies of metal ions incorporation in Langmuir-Blodgett films, Appl. Phys. A 94 (2009) 461-466.
10. S. I. Zheludeva, M. V. Kovalchuk, N. N. Novikova, A. N. Sosphenov, V. E. Erochin, L. A. Feigin, X-ray total external reflection fluorescence study of LB films on solid substrate, J. Phys. D Appl. Phys. 26 (1993) A202-A205.
11. M. K. Tiwari, G. M. Bhalerao, M. Babu, A. K. Sinha, C. Mukherjee, Investigation of metal nanoparticles on a Si surface using an X-ray standing wave field, J. Appl. Phys. 103 (2008) 054311-054316.
12. D. K. G. de Boer, Glancing-incidence X-ray fluorescence of layered materials, Phys. Rev. B 44 (1991) 498-511.
13. S. I. Zheludeva, M. V. Kovalchuk, N. N. Novikova, A. N. Sosphenov, X-ray standing waves in LSM for characterization of ultra-thin films, J. Phys. D Appl. Phys. 26 (1993) A206-A209.
14. Th. Holz, C. Streli, G. Pepponi, P. Wobrauschek, Standing wave fields for excitation in XRF - comparison of TXRF with Bragg reflection on multilayers, presented in the Denver X-ray conference, Colorado, USA, 2003.
15. L. G. Parratt, Surface studies of solids by total reflection of X-rays, Phys. Rev. 95 (1954) 359-369.
16. A. Krol, C. J. Sher, Y. H. Kao, X-ray fluorescence of layered synthetic materials with interfacial roughness, Phys. Rev. B 38 (1988) 8579-8592.
17. M. Born, W. Wolf, Principles of Optics, 5th EditionPergamon, Oxford, 1975.
18. T. C. Hung, W. Parrish, Characterization of single and multiple layer films by X-ray reflectrometry, Adv. X-ray Anal. 35 (1992) 137-142.
19. A. Iida, Grazing incidence X-ray fluorescence analysis using synchrotron radiation, Adv. X-ray Anal. 35 B (1992) 795-806.
20. B. W. Batterman, Effect of dynamical diffraction in X-Ray fluorescence scattering, Phys. Rev. 133 (1964) A759-A764.
21. J. A. Golovchenko, B. W. Batterman, W. L. Brown, Observation of internal X-ray wave fields during Bragg diffraction with an application to impurity lattice location, Phys. Rev. B 10 (1974) 4239-4243.
22. D. K. G. de Boer, A. J. G. Leenaers, W. W. van den Hoogenhof, Glancing-incidence Xray analysis of thin-layered materials: a review, X-ray Spectrom. 24 (1995) 91-102.
23. A. von Bohlen, Total reflection X-ray fluorescence and grazing incidence X-ray spectrometry - tools for micro-and surface analysis. A review, Spectrochim. Acta Part B 64 (2009) 821-832.
24. M. K. Tiwari, S. R. Naik, G. S. Lodha, R. V. Nandedkar, Effect of energy dependence of primary beam divergence on the X-ray standing wave characterization of layered materials, Anal. Sci. 21 (2005) 757-762.
25. M. K. Tiwari, G. S. Lodha, K. J. S. Sawhney, Applications of the 'CATGIXRF' computer program to the grazing incidence X-ray fluorescence and X-ray reflectivity characterization of thin films and surfaces, X-ray Spectrom 39 (2009) 127-134.
26. M. K. Tiwari, K. J. S. Sawhney, Tien-Lin Lee, S. G. Alcock, G. S. Lodha, Probing the average size of self-assembled metal nanoparticles using X-ray standing waves, Phys. Rev. B 80 (2009) 035434-035435.
27. K. J. S. Sawhney, I. P. Dolbnya, M. K. Tiwari, L. Alianelli, S. M. Scott, G. M. Preece, U. K. Pedersen and R. D. Walton, A Test beamline on Diamond Light Source, AIP Proceedings (2009) (in the press).
28. M. K. Tiwari, K. J. S. Sawhney, B. Gowri Sankar, V. K. Raghuvanshi, R. V. Nandedkar, A simple and precise total reflection X-ray fluorescence spectrometer: construction and its applications, Spectrochim. Acta Part B 59 (2004) 1141-1147.
29. M. K. Tiwari, B. Gowrishankar, V. K. Raghuvanshi, R. V. Nandedkar, K. J. S. Sawhney, Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis, Bull. Mater. Sci. 25 (5) (2002) 435-441.
30. S. Rai, M. K. Tiwari, G. S. Lodha, M. H. Modi, M. K. Chattopadhyay, S. Majumdar, S. Gardelis, Z. Viskadourakis, J. Giapintzakis, R. V. Nandedkar, S. B. Roy, P. Chaddah, Surface and interface study of pulsed-laserdeposited off-stoichiometric NiMnSb thin films on a Si (100) substrate, Phys. Rev. B 73 (2006) 0354175.