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Volumn 80, Issue 3, 2009, Pages

Probing the average size of self-assembled metal nanoparticles using x-ray standing waves

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EID: 69549114669     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.035434     Document Type: Article
Times cited : (24)

References (16)
  • 13
    • 69549092638 scopus 로고    scopus 로고
    • http:// www.diamond.ac.uk / Beamlines / Beamlineplan / B16/ index.htm
  • 14
    • 13444285568 scopus 로고
    • 10.1103/PhysRevB.44.498
    • D. K. G. de Boer, Phys. Rev. B 44, 498 (1991). 10.1103/PhysRevB.44.498
    • (1991) Phys. Rev. B , vol.44 , pp. 498
    • De Boer, D.K.G.1
  • 15
    • 69549134465 scopus 로고    scopus 로고
    • In the recursion method, for a layered specimen, the incident field Eji, and reflected field Ejr at the top of a jth layer canbe obtained from Ejr = aj2 Xj Eji, and E j+1 i = aj Eji tj 1+ a j+1 2 Xj+1 rj, where aj =exp (-i kj,Z dj) and Xj = (rj + a j+1 2 Xj+1) 1+ a j+1 2 Xj+1 rj. dj represents thickness of layer j.
    • In the recursion method, for a layered specimen, the incident field Eji, and reflected field Ejr at the top of a jth layer canbe obtained from Ejr = aj2 Xj Eji, and E j+1 i = aj Eji tj 1+ a j+1 2 Xj+1 rj, where aj =exp (-i kj,Z dj) and Xj = (rj + a j+1 2 Xj+1) 1+ a j+1 2 Xj+1 rj. dj represents thickness of layer j.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.