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In the recursion method, for a layered specimen, the incident field Eji, and reflected field Ejr at the top of a jth layer canbe obtained from Ejr = aj2 Xj Eji, and E j+1 i = aj Eji tj 1+ a j+1 2 Xj+1 rj, where aj =exp (-i kj,Z dj) and Xj = (rj + a j+1 2 Xj+1) 1+ a j+1 2 Xj+1 rj. dj represents thickness of layer j.
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