Effect of thickness on the microstructural, optoelectronic and morphological properties of electron beam evaporated ZnTe films

Journal of Alloys and Compounds

Volumn 502, Issue 2, 2010, Pages 434-438

  Balu, A R ^a,c   Nagarethinam, V S ^a,c   Thayumanavan, A ^a,c   Murali, K R ^b,c   Sanjeeviraja, C ^b,c   Jayachandran, M ^b,c  

^a A V V M SRI PUSHPAM COLLEGE   (India)

^b CENTRAL ELECTROCHEMICAL RESEARCH INSTITUTE   (India)

^c ALAGAPPA UNIVERSITY   (India)

Author keywords

II VI; Semiconductor; Thin films; ZnTe

Indexed keywords

BAND-GAP VALUES; CUBIC STRUCTURE; FIRST ORDER; GLASS SUBSTRATES; II-VI SEMICONDUCTOR; LASER RAMAN SPECTRA; LO PHONONS; MICRO-STRUCTURAL; MORPHOLOGICAL PROPERTIES; NANO GRAINS; PREFERENTIAL ORIENTATION; SECOND ORDERS; SUBSTRATE TEMPERATURE; THICKNESS OF THE FILM;

ELECTRON BEAMS; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SUBSTRATES; THIN FILMS;

ZINC COMPOUNDS;

EID: 77955176405     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.04.191     Document Type: Article

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