Structural and luminescent properties of ZnTe film grown on silicon by metalorganic chemical vapor deposition

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 20, Issue 6, 2002, Pages 1886-1890

  Shan, C X ^a   Fan, X W ^a   Zhang, J Y ^a   Zhang, Z Z ^a   Wang, X H ^a   Ma, J G ^a   Lu, Y M ^a   Liu, Y C ^a   Shen, D Z ^a   Kong, X G ^a   Zhong, G Z ^a  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; EXCITONS; LUMINESCENCE; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SCATTERING; SILICON; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

EXCITONS EMISSION;

METALLIC FILMS;

EID: 0036863378     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1507344     Document Type: Article

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