SCOPUS 정보 검색 플랫폼

Volumn 17, Issue 6, 1993, Pages 327-332

Refractive-index dispersion and optical-absorption edge of physically vapor-deposited films of the As35S65 chalcogenide glass

(4) Ramirez Malo J B a Marquez E a Villares, P a Jimenez Garay R a

a UNIVERSITY OF CÁDIZ (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; LIGHT ABSORPTION; LIGHT MEASUREMENT; LIGHT TRANSMISSION; MATHEMATICAL MODELS; REFRACTIVE INDEX; SPECTRUM ANALYSIS; THICKNESS MEASUREMENT; VAPOR DEPOSITION;

ABSORPTION COEFFICIENT; ARSENIC SULFUR CHALCOGENIDE GLASS; OPTICAL BAND GAP; PHYSICAL VAPOR DEPOSITION; REFRACTIVE INDEX DISPERSION; SURFACE PROFILING STYLUS; SWANEPOEL'S TECHNIQUE; TAUC'S PROCEDURE;

GLASS;

EID: 0027681332 PISSN: 0167577X EISSN: None Source Type: Journal
DOI: 10.1016/0167-577X(93)90120-M Document Type: Article

Times cited : (24)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.