Quality assessment of chalcopyrite thin films using Raman spectroscopy

Journal of Physics and Chemistry of Solids

Volumn 64, Issue 9-10, 2003, Pages 1977-1981

  Rudigier, Eveline ^a   Alvarez Garcia, Jacobo ^b   Luck, Ilka ^a   Klaer, Jo ^a   Scheer, Roland ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF BARCELONA   (Spain)

Author keywords

C. Raman spectroscopy

Indexed keywords

COPPER COMPOUNDS; ELECTRIC POTENTIAL; RAMAN SPECTROSCOPY; SOLAR CELLS;

CRYSTAL QUALITY;

THIN FILMS;

EID: 0042737734     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(03)00154-9     Document Type: Conference Paper

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