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Volumn 4, Issue 4, 2010, Pages 250-262

Digital microfluidic logic gates and their application to built-in self-test of lab-on-chip

Author keywords

Dependability; lab on chip; logic gates; microfluidics; testing

Indexed keywords

CAPACITIVE SENSING; DEPENDABILITY; DIGITAL MICROFLUIDICS; ERROR PRONES; LAB-ON-CHIP; LOW OVERHEAD; MULTIPLE TEST; NOT GATE; PULSE SEQUENCE ANALYSIS; SINGLE DROPLET; TEST METHOD; TESTING METHOD;

EID: 77955176249     PISSN: 19324545     EISSN: None     Source Type: Journal    
DOI: 10.1109/TBCAS.2010.2048567     Document Type: Article
Times cited : (25)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.