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Volumn 31, Issue 6, 2010, Pages
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Simulation and optimization of a 6H-SiC metal-semiconductor-metal ultraviolet photodetector
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Author keywords
I V characteristics; MSM structure; Schottky contact; ultraviolet photodetector
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Indexed keywords
DEVICE PARAMETERS;
DIFFERENT STRUCTURE;
ELECTRODE SPACING;
IV CHARACTERISTICS;
METAL SEMICONDUCTOR METAL;
MSM PHOTODETECTOR;
MSM STRUCTURES;
ORDERS OF MAGNITUDE;
SCHOTTKY CONTACTS;
SIMULATION AND OPTIMIZATION;
SIMULATION PACKAGES;
SIMULATION RESULT;
THERMIONIC EMISSION THEORY;
ULTRA-VIOLET PHOTODETECTORS;
COMPUTER SIMULATION;
DARK CURRENTS;
METALS;
OPTIMIZATION;
OPTOELECTRONIC DEVICES;
PHOTOCURRENTS;
PHOTODETECTORS;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON CARBIDE;
THERMIONIC EMISSION;
CURRENT VOLTAGE CHARACTERISTICS;
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EID: 77954799157
PISSN: 16744926
EISSN: None
Source Type: Journal
DOI: 10.1088/1674-4926/31/6/064010 Document Type: Article |
Times cited : (5)
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References (11)
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