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Volumn 651, Issue , 2010, Pages 131-153

Composition-induced microstrain broadening: From pattern decomposition to whole powder pattern modelling procedures

Author keywords

Composition variations; Interstitial nitrides; Line broadening analysis; Microstrain; Powder diffraction; X ray diffraction

Indexed keywords

X RAY DIFFRACTION;

EID: 77954771672     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.651.131     Document Type: Conference Paper
Times cited : (3)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.