WPPM: Microstructural analysis beyond the Rietveld method

Materials Science Forum

Volumn 651, Issue , 2010, Pages 155-171

  Scardi, P ^a   Ortolani, M ^a   Leoni, M ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

Full pattern methods; Line profile analysis; Powder diffraction; Whole powder pattern modeling; X ray diffraction

Indexed keywords

METAL WORKING; RIETVELD ANALYSIS; X RAY DIFFRACTION;

DEFORMED METALS; FULL PATTERN METHODS; LINE BROADENING; LINE PROFILE ANALYSIS; MICROSTRUCTURAL ANALYSIS; PM2K SOFTWARES; POWDER DIFFRACTION; WHOLE POWDER PATTERN MODELING;

POWDER METALS;

EID: 77954765715     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.651.155     Document Type: Conference Paper

References (52)

1. Scherrer P.,1918, Nachr. Ges. Wiss. Göttingen, 26 September, 98-100.
2. Sanoj M. A., Reshmi C. P., Varma M.R., 2009, J. Am. Ceram. Soc. 92, 2648-2653;
3. Hahn S. I., Hwang S. J., 2009, J. Alloys Compd. 483, 207-208.
4. Matos J. M. E. et al., 2009, Mater. Chem. Phys. 117, 455-459;
5. Pattabi R. M., Pattabi M., 2009, Spectrochim. Acta A 74, 195-199;
6. Xue W. et al., 2009, Catal. Commun 11, 29-33.
7. Klug, H. P. & Alexander, L. E., 1974, X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed. (New York: Wiley).
8. Warren, B. E. (1969). X-ray Diffraction (Reading MS : Addison-Wesley).
9. Guinier A., 1963, X-ray diffraction in crystals imperfect crystals and amorphous bodies, transl. P Lorrain and D Sainte-Marie Lorrain (San Francisco: Freeman).
10. Snyder R. L., Fiala J., Bunge H. J. (Editors), 1999, Defect and Microstructure Analysis by Diffraction, IUCr series, (New York : Oxford University Press).
11. MDI, JADE 9.0, MDI, 1224 Concannon Blvd. Livermore, California 94550.
12. PANalytical Line Profile Analysis 1.0, Lelyweg 1, 7602 EA, Almelo, The Netherlands.
13. plus TOPAS V4.2 User's Manual", Bruker AXS, Karlsruhe, Germany, DOC-M88-EXX065 V4.2 - 01.2009.
14. Dong Y.H. & Scardi P., 2000, J. Appl. Cryst. 33, 184-189.
15. Young, R.A., 1993, The Rietveld Method. (Oxford: Oxford University Press).
16. Wertheim, G. K., Butler, M. A., West, K. W. &. Buchanan, D. N. E., 1974, Rev. Sci. Instrum. 45, 1369-1375
17. Abramowitz M., Stegun I.A., eds., 1972, Handbook of Mathematical Functions with Formulas, Graphs, and Mathematical Tables (New York: Dover).
18. Scardi P. & Leoni M., 2002, Acta Cryst. A 58, 190-200.
19. Scardi P. & Leoni M., 2004, in Diffraction Analysis of the Microstructure of Materials, edited by E.J. Mittemeijer & P. Scardi (Berlin: Springer), pp. 51-91.
20. Scardi P. & Leoni M., 2001, Acta Cryst. A 57, 604-613.
21. Leoni M., Confente T. & Scardi P., 2006, Z. Kristallogr. Suppl. 23, 249-254.
22. Williamson, G. K. & Hall, W. H.,1953, Acta Metall. 1, 22-31.
23. Warren, B. E. & Averbach, B. L., 1950, J. Appl. Phys. 21, 595-599.
24. Bergmann J., Kleeberg R., 1999, Z. Kristallogr. Suppl. 16, 133-143.
25. D'Incau M., Leoni M. & Scardi P., 20027, J. Mat. Research 22, 1744-1753.
26. Scardi P. & Leoni M., 1999, J. Appl. Cryst. 32, 671-682;
27. Scardi P., Lutterotti L. & Maistrelli P., 1994, Powder Diffr. 9, 180-186.
28. Caglioti, G., Paoletti, A. & Ricci, F. P., 1958, Nucl. Instrum. Meth. 3, 223-228.
29. Cline J.P., Deslattes R.D., Staudenmann J.-L., Kessler E.G., Hudson L.T., Henins A. & Cheary R.W., 2000, Certificate SRM660a, NIST, Gaithersburg, MD, USA.
30. Cheary R. W. & Coelho, A., 1992, J. Appl. Cryst. 25, 109-121.
31. Wilson, A. J. C.,1963, Mathematical Theory of X-ray Powder Diffractometry, (Eindhoven, The Netherland: Philips Technical Library).
32. Hölzer G., Fritsch M., Deutsch M., Härtwig J. & Förster E., 1997, Phys. Rev. A 56, 4554-4568.
33. Wilson A. J. C., 1962, X-ray Optics, 2nd Ed. (London: Methuen).
34. Leoni M. & Scardi P., 2004, J. Appl. Cryst. 37, 629-634.
35. Krivoglaz, M. A. & Ryaboshapka, K. P., 1963, Fiz. Met. Metalloved. 15, 18-31.
36. Wilkens, M., 1970, Phys. Stat. Sol. A 2, 359-370.
37. Martinez-Garcia J., Leoni M. & Scardi P., 2010, Mat. Sci Forum. This issue.
38. Klimanek, P. & Kuzel, R. Jr, 1988, J. Appl. Cryst. 21, 59-66.
39. Martinez-Garcia J., Leoni M. & Scardi P., 2009, Acta Cryst. A 65, 109-119.
40. Borbély A., Dragomir-Cernatescu J., Ribárik G. & Ungár T., 2003, J. Appl. Cryst. 36, 160-162.
41. Leoni M., Martinez-Garcia J., Scardi P., 2007, J. Appl. Cryst. 40, 719-724.
42. Scardi, P. 2002, Z. Kristallogr. 217, 420-421.
43. Scardi P., 2008, in Powder Diffraction: Theory and Practice, edited by R.E. Dinnebier & S.J.L. Billinge, (The Royal Society of Chemistry, Cambridge, United Kingdom), pp. 376-413.
44. Wilkens, M., 1970, in Fundamental aspects of dislocation theory, edited by J. A. Simmons, R. de Witt & R. Bullough (NBS Spec. Publ. 317), pp.1195-1221.
45. Martinez-Garcia J., Leoni M. & Scardi P., 2007, Phys. Rev. B 76 [17], 174117.
46. Martinez-Garcia J., Leoni M. & Scardi P., 2008, Phil. Mag. Lett. 88 [6], 443-451.
47. Velterop L., Delhez R., de Keijser Th. H., Mittemeijer E. J. & Reefman D., 2000, J. Appl. Cryst. 33, 296-306.
48. Estevez-Rams E., Leoni M., Scardi P., Aragon-Fernandez B. & Fuess H., 2003, Phil. Mag. 83, 4045-4057.
49. Estevez-Rams E., Welzel U., Pentón Madrigal A. & Mittemeijer E. J., 2008, Acta Cryst. A 64, 537-548.
50. Scardi P.& Leoni M., 2005, Acta Materialia 53, 5229-5239.
51. A. J. C. Wilson and L. Zsoldos, 1966, Proc. Roy. Soc. Lond. A 290, 508-514.
52. Leineweber A., Mittemeijer E.J., 2004, J. Appl. Cryst. 37, 123-135.