Scanning tunneling potentiometry study of electron reflectivity of a single grain boundary in thin gold films

Journal of Electronic Materials

Volumn 26, Issue 4, 1997, Pages 383-386

  Schneider, M A ^a   Wenderoth, M ^a   Heinrich, A J ^a   Rosentreter, M A ^a   Ulbrich, R G ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Grain boundary scattering; Scanning tunneling microscopy (STM); Scanning tunneling potentiometry (STP); Thin film resistivity

Indexed keywords

CURRENT DENSITY; ELECTRON REFLECTION; GOLD; GRAIN BOUNDARIES; NANOTECHNOLOGY; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

SCANNING TUNNELING POTENTIOMETRY (STP);

SEMICONDUCTING FILMS;

EID: 0031124366     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-997-0106-8     Document Type: Article

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