Local conductance measurement of few-layer graphene on SiC substrate using an integrated nanogap probe

Journal of Physics: Conference Series

Volumn 100, Issue PART 5, 2008, Pages

  Nagase, M ^a   Hibino, H ^a   Kageshima, H ^a   Yamaguchi, H ^a  

^a NTT Basic Research Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; NANOSTRUCTURES; PROBES; SILICON CARBIDE;

CONDUCTANCE MEASUREMENT; ELECTRICAL TRANSPORT MEASUREMENTS; FEW-LAYER GRAPHENE; IN-SITU OBSERVATIONS; LOW ENERGY ELECTRON MICROSCOPY; NUMBER OF LAYERS; SIC SUBSTRATES; SPATIALLY RESOLVED;

GRAPHENE;

EID: 77954336700     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/100/5/052006     Document Type: Conference Paper

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