Characterization of small-scale batch-fabricated carbon nanofiber probes

Journal of Physics: Conference Series

Volumn 100, Issue PART 5, 2008, Pages

  Kitazawa, M ^a,b   Ohta, R ^a   Sugita, Y ^b   Tanaka, J ^b   Tanemura, M ^b  

^a OLYMPUS CORPORATION   (Japan)

^b NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CARBON NANOFIBERS; ION BOMBARDMENT; NANOCANTILEVERS; NANOFIBERS; YARN;

CARBON NANOTUBES PROBE; CONDUCTIVE DIAMONDS; HIGH ASPECT RATIO; HIGHER RESOLUTION IMAGES; IRRADIATION METHODS; MECHANICAL AND ELECTRICAL PROPERTIES; SCANNING SPREADING RESISTANCE MICROSCOPY; SINGLE CARBON NANOFIBERS;

PROBES;

EID: 77954331418     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/100/5/052005     Document Type: Conference Paper

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