Characterization of core/shell nanoparticle thin films for gas analytical applications

Surface and Interface Analysis

Volumn 42, Issue 6-7, 2010, Pages 1131-1134

  Fuchs, M ^a   Breitenstein, D ^b   Fartmann, M ^b   Grehl, T ^c   Kayser, S ^c   Koester, R ^a   Ochs, R ^a   Schlabach, S ^a   Szabo D V ^a   Bruns, M ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b TASCON GMBH   (Germany)

^c ION TOFGmbH ^*  (Germany)

Author keywords

Core shell nanoparticles; Gas sensors; LEIS; Nanoparticle films; SEM; Silicon dioxide; Stannic oxide; TEM; Tin dioxide; XPS

Indexed keywords

CORE/SHELL NANOPARTICLES; GAS SENSORS; NANOPARTICLE FILMS; SEM; SILICON DIOXIDE; STANNIC OXIDE; TEM; XPS;

ELECTRON ENERGY LOSS SPECTROSCOPY; GAS DETECTORS; GASES; METALLIC FILMS; MONOLAYERS; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; SENSORS; SHELLS (STRUCTURES); SILICA; SILICON OXIDES; TIN; TIN DIOXIDE; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; ULTRATHIN FILMS; VAPOR DEPOSITION; X RAY PHOTOELECTRON SPECTROSCOPY;

NANOPARTICLES;

EID: 77954283137     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3223     Document Type: Conference Paper

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