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Volumn 107, Issue 12, 2010, Pages

Substrate influence on the optical and structural properties of pulsed laser deposited BiFeO3 epitaxial films

(10) Himcinschi, C a,d Vrejoiu, I b Friedrich, M a Nikulina, E b Ding, L a Cobet, C c Esser, N c Alexe, M b Rafaja, D d Zahn, D R T a

a CHEMNITZ UNIVERSITY OF TECHNOLOGY (Germany)

b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

c ISAS INSTITUTE FOR ANALYTICAL SCIENCES (Germany)

d TU BERGAKADEMIE FREIBERG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BLUE SHIFT; COMPRESSIVE STRAIN; DIELECTRIC FUNCTIONS; ENERGY BANDGAPS; HIGH RESOLUTION X RAY DIFFRACTION; MICRO RAMAN SPECTROSCOPY; PULSED LASER; SRTIO; VACUUM ULTRAVIOLETS; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

OPTICAL PROPERTIES; PULSED LASER DEPOSITION; PULSED LASERS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SPECTROSCOPIC ELLIPSOMETRY; STRONTIUM ALLOYS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL FILMS;

EID: 77954196566 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3437059 Document Type: Article

Times cited : (63)

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