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Volumn 92, Issue 22, 2008, Pages

Characterization of electronic structure and defect states of thin epitaxial BiFeO3 films by UV-visible absorption and cathodoluminescence spectroscopies

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ELECTRONIC STRUCTURE;

EID: 44849131250     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2939101     Document Type: Article
Times cited : (189)

References (19)
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    • NMAACR 1476-1122 10.1038/nmat1805.
    • R. Ramesh and N. A. Spaldin, Nat. Mater. NMAACR 1476-1122 10.1038/nmat1805 6, 21 (2007).
    • (2007) Nat. Mater. , vol.6 , pp. 21
    • Ramesh, R.1    Spaldin, N.A.2
  • 7
    • 35348843467 scopus 로고    scopus 로고
    • SCMAF7 1359-6462 10.1016/j.scriptamat.2007.09.001.
    • J. Wei, D. S. Xue, and Y. Xu, Scr. Mater. SCMAF7 1359-6462 10.1016/j.scriptamat.2007.09.001 58, 45 (2008).
    • (2008) Scr. Mater. , vol.58 , pp. 45
    • Wei, J.1    Xue, D.S.2    Xu, Y.3
  • 17
    • 34047129665 scopus 로고    scopus 로고
    • APPLAB 0003-6951 10.1063/1.2716868.
    • S. J. Clark and J. Robertson, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2716868 90, 132903 (2007).
    • (2007) Appl. Phys. Lett. , vol.90 , pp. 132903
    • Clark, S.J.1    Robertson, J.2
  • 18
    • 44849121224 scopus 로고    scopus 로고
    • personal communication (February 21)
    • J. Robertson, personal communication (February 21, 2008).
    • (2008)
    • Robertson, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.