-
1
-
-
49249095684
-
-
IEEPAD 0018-9219. 10.1109/JPROC.2007.911060
-
U. K. Mishra, L. Shen, T. E. Kazior, and Y. F. Wu, Proc. IEEE IEEPAD 0018-9219 96, 287 (2008). 10.1109/JPROC.2007.911060
-
(2008)
Proc. IEEE
, vol.96
, pp. 287
-
-
Mishra, U.K.1
Shen, L.2
Kazior, T.E.3
Wu, Y.F.4
-
2
-
-
72949117866
-
-
EDLEDZ 0741-3106. 10.1109/LED.2009.2034875
-
A. Crespo, M. M. Bellot, K. D. Chabak, J. K. Gillespie, G. H. Jessen, V. Miller, M. Trejo, G. D. Via, D. E. Walker, B. W. Winningham, H. E. Smith, T. A. Cooper, X. Gao, and S. Guo, IEEE Electron Device Lett. EDLEDZ 0741-3106 31, 2 (2010). 10.1109/LED.2009.2034875
-
(2010)
IEEE Electron Device Lett.
, vol.31
, pp. 2
-
-
Crespo, A.1
Bellot, M.M.2
Chabak, K.D.3
Gillespie, J.K.4
Jessen, G.H.5
Miller, V.6
Trejo, M.7
Via, G.D.8
Walker, D.E.9
Winningham, B.W.10
Smith, H.E.11
Cooper, T.A.12
Gao, X.13
Guo, S.14
-
3
-
-
72949106901
-
-
EDLEDZ 0741-3106. 10.1109/LED.2009.2035145
-
N. Sarazin, E. Morvan, M. A. di Forte Poisson, M. Oualli, C. Gaquiere, O. Jardel, O. Drisse, M. Tordjman, M. Magis, and S. L. Delage, IEEE Electron Device Lett. EDLEDZ 0741-3106 31, 11 (2010). 10.1109/LED.2009.2035145
-
(2010)
IEEE Electron Device Lett.
, vol.31
, pp. 11
-
-
Sarazin, N.1
Morvan, E.2
Di Forte Poisson, M.A.3
Oualli, M.4
Gaquiere, C.5
Jardel, O.6
Drisse, O.7
Tordjman, M.8
Magis, M.9
Delage, S.L.10
-
4
-
-
0001581628
-
-
APPLAB 0003-6951. 10.1063/1.119440
-
T. Matsuoka, Appl. Phys. Lett. APPLAB 0003-6951 71, 105 (1997). 10.1063/1.119440
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 105
-
-
Matsuoka, T.1
-
5
-
-
0035151238
-
Analysis of phase-separation region in wurtzite group III nitride quaternary material system using modified valence force field model
-
DOI 10.1016/S0022-0248(00)00869-1
-
T. Takayama, M. Yuri, K. Itoh, T. Baba, and J. S. Harris, J. Cryst. Growth JCRGAE 0022-0248 222, 29 (2001). 10.1016/S0022-0248(00)00869-1 (Pubitemid 32092239)
-
(2001)
Journal of Crystal Growth
, vol.222
, Issue.1-2
, pp. 29-37
-
-
Takayama, T.1
Yuri, M.2
Itoh, K.3
Baba, T.4
Harris Jr., J.S.5
-
6
-
-
20844450872
-
Demonstration of undoped quaternary AlInGaNGaN heterostructure field-effect transistor on sapphire substrate
-
DOI 10.1063/1.1942643, 223510
-
Y. Liu, H. Jiang, S. Arulkumaran, T. Egawa, B. Zhang, and H. Ishikawa, Appl. Phys. Lett. APPLAB 0003-6951 86, 223510 (2005). 10.1063/1.1942643 (Pubitemid 40861638)
-
(2005)
Applied Physics Letters
, vol.86
, Issue.22
, pp. 1-3
-
-
Liu, Y.1
Jiang, H.2
Arulkumaran, S.3
Egawa, T.4
Zhang, B.5
Ishikawa, H.6
-
7
-
-
77955798610
-
-
ZZZZZZ 1610-1634. 10.1002/pssc.200880944
-
L. R. Khoshroo, C. Mauder, H. Behmenburg, J. Woitok, W. Zander, J. Gruis, B. Reuters, J. Schubert, A. Vescan, M. Heuken, H. Kalisch, and R. H. Jansen, Phys. Status Solidi C ZZZZZZ 1610-1634 6, S470 (2009). 10.1002/pssc.200880944
-
(2009)
Phys. Status Solidi C
, vol.6
, pp. 470
-
-
Khoshroo, L.R.1
Mauder, C.2
Behmenburg, H.3
Woitok, J.4
Zander, W.5
Gruis, J.6
Reuters, B.7
Schubert, J.8
Vescan, A.9
Heuken, M.10
Kalisch, H.11
Jansen, R.H.12
-
8
-
-
27344455305
-
Growth of AlGaN/GaN based electronic device structures with semi-insulating GaN buffer and AlN interlayer
-
DOI 10.1002/pssc.200461288
-
S. Müller, K. Köhler, R. Kiefer, R. Quay, M. Baeumler, and L. Kirste, Phys. Status Solidi C ZZZZZZ 1610-1634 2, 2639 (2005). 10.1002/pssc.200461288 (Pubitemid 41524988)
-
(2005)
Physica Status Solidi C: Conferences
, vol.2
, Issue.7
, pp. 2639-2642
-
-
Muller, S.1
Kohler, K.2
Kiefer, R.3
Quay, R.4
Baeumler, M.5
Kirste, L.6
-
9
-
-
77949769413
-
-
ZZZZZZ 1610-1634. 10.1002/pssc.200778411
-
R. Aidam, L. Kirste, M. Kunzer, S. Müller, and P. Waltereit, Phys. Status Solidi C ZZZZZZ 1610-1634 5, 1902 (2008). 10.1002/pssc.200778411
-
(2008)
Phys. Status Solidi C
, vol.5
, pp. 1902
-
-
Aidam, R.1
Kirste, L.2
Kunzer, M.3
Müller, S.4
Waltereit, P.5
-
10
-
-
0037425175
-
-
APPLAB 0003-6951. 10.1063/1.1566465
-
E. Monroy, N. Gogneau, D. Jalabert, E. Bellet-Amalric, Y. Hori, F. Enjalbert, L. S. Dang, and B. Daudin, Appl. Phys. Lett. APPLAB 0003-6951 82, 2242 (2003). 10.1063/1.1566465
-
(2003)
Appl. Phys. Lett.
, vol.82
, pp. 2242
-
-
Monroy, E.1
Gogneau, N.2
Jalabert, D.3
Bellet-Amalric, E.4
Hori, Y.5
Enjalbert, F.6
Dang, L.S.7
Daudin, B.8
-
11
-
-
54849433647
-
-
PSSABA 0031-8965. 10.1002/pssa.200778442
-
P. Waltereit, W. Bronner, R. Quay, M. Dammann, S. Müller, R. Kiefer, B. Raynor, M. Mikulla, and G. Weimann, Phys. Status Solidi A PSSABA 0031-8965 205, 1078 (2008). 10.1002/pssa.200778442
-
(2008)
Phys. Status Solidi A
, vol.205
, pp. 1078
-
-
Waltereit, P.1
Bronner, W.2
Quay, R.3
Dammann, M.4
Müller, S.5
Kiefer, R.6
Raynor, B.7
Mikulla, M.8
Weimann, G.9
-
12
-
-
33747119032
-
High electron mobility lattice-matched AllnN/GaN field-effect transistor heterostructures
-
DOI 10.1063/1.2335390
-
M. Gonschorek, J. F. Carlin, E. Feltin, M. A. Py, and N. Grandjean, Appl. Phys. Lett. APPLAB 0003-6951 89, 062106 (2006). 10.1063/1.2335390 (Pubitemid 44222934)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.6
, pp. 062106
-
-
Gonschorek, M.1
Carlin, J.-F.2
Feltin, E.3
Py, M.A.4
Grandjean, N.5
-
13
-
-
34848922373
-
High electron mobility in nearly lattice-matched AlInNAlNGaN heterostructure field effect transistors
-
DOI 10.1063/1.2794419
-
J. Q. Xie, X. F. Ni, M. Wu, J. H. Leach, U. Ozgue, and H. Morkoc, Appl. Phys. Lett. APPLAB 0003-6951 91, 132116 (2007). 10.1063/1.2794419 (Pubitemid 47502576)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.13
, pp. 132116
-
-
Xie, J.1
Ni, X.2
Wu, M.3
Leach, J.H.4
Ozgur, U.5
Morko, H.6
-
15
-
-
31144455925
-
Molecular beam epitaxy of InAlN/GaN heterostructures for high electron mobility transistors
-
DOI 10.1116/1.1927103
-
D. S. Katzer, D. F. Storm, S. C. Binari, B. V. Shanabrook, A. Torabi, L. Zhou, and D. J. Smith, J. Vac. Sci. Technol. B JVTBD9 1071-1023 23, 1204 (2005). 10.1116/1.1927103 (Pubitemid 43127346)
-
(2005)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.23
, Issue.3
, pp. 1204-1208
-
-
Katzer, D.S.1
Storm, D.F.2
Binari, S.C.3
Shanabrook, B.V.4
Torabi, A.5
Zhou, L.6
Smith, D.J.7
-
16
-
-
34248593402
-
Lattice-matched InAlN/GaN two-dimensional electron gas with high mobility and sheet carrier density by plasma-assisted molecular beam epitaxy
-
DOI 10.1016/j.jcrysgro.2007.03.035, PII S002202480700293X
-
K. Jeganathan, M. Shimizu, H. Okumura, Y. Yano, and N. Akutsu, J. Cryst. Growth JCRGAE 0022-0248 304, 342 (2007). 10.1016/j.jcrysgro.2007.03.035 (Pubitemid 46755209)
-
(2007)
Journal of Crystal Growth
, vol.304
, Issue.2
, pp. 342-345
-
-
Jeganathan, K.1
Shimizu, M.2
Okumura, H.3
Yano, Y.4
Akutsu, N.5
-
17
-
-
77954144413
-
GaN-Based Submicrometer HEMTs with Lattice-Matched InAlGaN Barrier Grown by MBE
-
EDLEDZ 0741-3106 (to be published)
-
T. Lim, R. Aidam, P. Waltereit, T. Henkel, R. Quay, R. Lozar, T. Maier, L. Kirste, and O. Ambacher, " GaN-Based Submicrometer HEMTs with Lattice-Matched InAlGaN Barrier Grown by MBE.," IEEE Electron Device Lett. EDLEDZ 0741-3106 (to be published).
-
IEEE Electron Device Lett.
-
-
Lim, T.1
Aidam, R.2
Waltereit, P.3
Henkel, T.4
Quay, R.5
Lozar, R.6
Maier, T.7
Kirste, L.8
Ambacher, O.9
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