Accurate measurement of Fe-Ni alloy film composition using XPS method

Xiyou Jinshu/Chinese Journal of Rare Metals

Volumn 34, Issue 3, 2010, Pages 431-435

  Wang, Hai ^a   Cheng, Bin ^b   Song, Xiaoping ^a   Liu, Fen ^c  

^a NATIONAL INSTITUTE OF METROLOGY   (China)

^b BEIJING UNIVERSITY OF CHEMICAL TECHNOLOGY   (China)

^c INSTITUTE OF CHEMISTRY   (China)

Author keywords

Accurate measurement; Fe Ni alloy film; X ray photoelectron spectroscopy

Indexed keywords

EID: 77953968162     PISSN: 02587076     EISSN: None     Source Type: Journal    
DOI: 10.3969/j.issn.0258-7076.2010.03.021     Document Type: Article

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