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Volumn 216, Issue 2, 1998, Pages 115-122
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Friction and pull-off forces on submicron-size asperities
a b,c
b
CHUO UNIVERSITY
(Japan)
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Author keywords
AFM; Focused ion beam; Friction force; JKR theory; Pull off force; Radius of curvature
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FORCE MEASUREMENT;
ION BEAMS;
SILICON WAFERS;
SURFACE ROUGHNESS;
TRIBOLOGY;
FOCUSED ION BEAMS;
PULL OFF FORCES;
FRICTION;
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EID: 0032050490
PISSN: 00431648
EISSN: None
Source Type: Journal
DOI: 10.1016/S0043-1648(97)00158-0 Document Type: Article |
Times cited : (74)
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References (15)
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