Density and refractive index of thin evaporated films

Chinese Optics Letters

Volumn 8, Issue SUPPL., 2010, Pages 67-72

  Mergel, Dieter ^a   Jerman, Martin ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EVAPORATED FILMS; INTENSIVE LASERS; MASS DENSITIES; OXYGEN PARTIAL PRESSURE; POST ANNEALING; SINGLE GRAINS; SUBSTRATE TEMPERATURE; THIN FILM EVAPORATION; TIO;

FILM PREPARATION; HAFNIUM COMPOUNDS; HEATING; LIGHT REFRACTION; OPTICAL COATINGS; ORGANIC POLYMERS; OXYGEN; REFRACTIVE INDEX; REFRACTOMETERS; SILICON COMPOUNDS;

OPTICAL MULTILAYERS;

EID: 77953281438     PISSN: 16717694     EISSN: None     Source Type: Journal    
DOI: 10.3788/COL201008Sl.0067     Document Type: Article

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