Density and refractive index of TiO2 films prepared by reactive evaporation

Thin Solid Films

Volumn 371, Issue 1, 2000, Pages 218-224

  Mergel, D ^a   Buschendorf, D ^a   Eggert, S ^a   Grammes, R ^a   Samset, B ^b  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b UNIVERSITY OF OSLO   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (OPTICAL); DEPOSITION; EVAPORATION; FILM PREPARATION; PRESSURE EFFECTS; REFRACTIVE INDEX; SUBSTRATES; THIN FILMS; TITANIUM DIOXIDE;

CLAUSIUS-MOSOTTI ANALYSIS; LORENTZ-LORENTZ PLOT; REACTIVE EVAPORATION;

AMORPHOUS FILMS;

EID: 0033715072     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01015-4     Document Type: Article

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