Structural and spectroscopic ellipsometry characterization for electrodeposited ZnO growth at different hydrogen peroxide concentration

Thin Solid Films

Volumn 518, Issue 15, 2010, Pages 4150-4155

  El Hichou, A ^a   Stein, N ^b   Boulanger, C ^b   Johann, L ^c  

^a FACULTÉ DES SCIENCES ET TECHNIQUES GUÉLIZ   (Morocco)

^b INSTITUT JEAN LAMOUR   (France)

^c UNIVERSITÉ DE LORRAINE   (France)

Author keywords

Electrodeposition; Ellipsometry; Optical constants; Scanning electron microscopy; Transparent conducting oxides; X ray diffraction; Zinc oxide

Indexed keywords

CHRONOAMPEROMETRY; ELECTRODEPOSITION; ELECTRODES; ELLIPSOMETRY; HYDROGEN PEROXIDE; II-VI SEMICONDUCTORS; OPTICAL CONSTANTS; PEROXIDES; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ELLIPSOMETRY; TRANSPARENT CONDUCTING OXIDES; X RAY DIFFRACTION; ZINC OXIDE;

CYCLIC VOLTAMETRY; ELECTRODEPOSITION PROCESS; HYDROGEN PEROXIDE CONCENTRATION; NORMAL DISPERSION; OPTICAL CHARACTERIZATION; PREFERRED GROWTH; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS; THICKNESS OF FILMS;

OXIDATION;

EID: 77953151400     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.11.070     Document Type: Article

References (47)

1. Jin Z.C., Hamberg J., and Granqvist C.G. J. Appl. Phys. 64 (1988) 5117
2. Yoo J.B., Fahrenbruch A.L., and Bube R.H. J. Appl. Phys. 68 (1990) 4694
3. Major S., Kumar S., Bhatnagar M., and Chopra K.L. Appl. Phys. Lett. 49 (1986) 394
4. Chen Y., Bagnall D.M., and Yao T. Mater. Sci. Eng. B 75 (2000) 190
5. Kong Y.C., Yu D.P., Zhang B., Fang W., and Feng S.Q. Appl. Phys. Lett. 78 (2001) 407
6. Chopra K.L., Major S., and Pandya D.K. Thin Solid Films 102 (1983) 1
7. Muller J., and Weissenrieder S. J. Anal. Chem. 349 (1994) 380
8. Lin F.C., Takao Y., Shimizu Y., and Egashira M. Sens. Actuators B 24-25 (1995) 843
9. Reynolds D.C., Look D.C., and Jogai B. Solid State Commun. 99 (1996) 873
10. Tang Z.K., Wong G.K.L., Yu P., Kawasaki M., Ohtomo A., Koinuma H., and Segawa Y. Appl. Phys. Lett. 72 (1998) 3270
11. Aranovich J.L., Golmayo D., Fahrenbruch A.L., and Bube R.H. J. Appl. Phys. 51 (1980) 4260
12. Stolt L., Hedstrom J., Ruckh M., Kessler J., Velthaus K.O., and Schock H.W. Appl. Phys. Lett. 62 (1993) 597
13. Minami T., Yamamoto T., and Miyata T. Thin Solid Films 366 (2000) 63
14. Ateav B.M., Bagamadova A.M., Mamedov V.V., and Omaev A.K. Mater. Sci. Eng. B 65 (1999) 159
15. Sun X.W., and Kwok H.S. J. Appl. Phys. 86 (1999) 408
16. El Hichou A., Addou M., Ebothé J., and Troyon M. J. Lumin. 113 (2005) 183
17. Sun X., Deng Z., and Li Y. Mater. Chem. Phys. 80 (2003) 366
18. Lincot D. Thin Solid Films 487 (2005) 40
19. Peulon S., and Lincot D. J. Electrochem. Soc. 145 (1998) 864
20. Peulon S., and Lincot D. Adv. Mater. 8 (1996) 166
21. Yoshida T., Pauporte T., Lincot D., Oekermann T., and Minoura H. J. Electrochem. Soc. 150 (2003) 608
22. Izaki M., and Omi T. J. Electrochem. Soc. 143 (1996) 53
23. Izaki M., and Omi T. Appl. Phys Lett. 68 (1996) 2439
24. Canava B., and Lincot D. J. Appl. Electrochm. 30 (2000) 711
25. Pauporte T., and Lincot D. J. Electrochem. Soc. 148 (2001) 310
26. Pauporte T., and Lincot D. J. Electroanal. Chem. 517 (2001) 54
27. Wang Q., Wang G., Jie J., Han X., Xu B., and Hou J.G. Thin Solid Films 492 (2005) 61
28. Marotti R.E., Giorgi P., Machado G., and Dalchiele E.A. Sol. Energy Mater. Sol. Cells 90 (2006) 2356
29. Ramirez D., Silva D., Gomez H., Riveros G., Marotti R.E., Dalchiele E.A., and Mathew-Xavier. Sol. Energy Mater. Sol. Cells 91 (2007) 1458
30. Goux A., Pauporté T., Chivot J., and Lincot D. Electrochim. Acta 50 (2005) 2239
31. Mahalingam T., John V.S., Raja M., Su Y.K., and Sebastian P.J. Sol. Energy Mater. Sol. Cells 88 (2005) 227
32. Yingling Y., Hongwei Y., Zhengping F., Beifang Y., Linsheng X., Yuandong X., Jian Z., and Fanqinq L. Solid State Commun. 138 (2006) 521
33. Inamdar A.I., Mujawar S.H., Sadale S.B., Sonavane A.C., Shelar M.B., Shinde P.S., and Patil P.S. Sol. Energy Mater. Sol. Cells 91 (2007) 864
34. Stein N., Rocca E., Kleim R., Lecuire J.M., and McRae E. Electrochim. Acta. 44 (1998) 445
35. Fahoume M., Maghfoul O., Aggour M., Hartiti B., Chraibi F., and Ennaoui A. Sol. Energy Mater. Sol. Cells 90 (2006) 1437
36. Broch L., and Johann L. Phys. Status Solidi C 5 (2008) 1036
37. Broch L., Johann L., Stein N., Zimmer A., and Beck R. Rev. Sci. Instrum. 78 (2007) 6
38. Scherrer P. Nachr. Ges. Wiss. Göttingen (1918) 98
39. Azzam R.M.A., and Bashara N.M. Ellipsometry and Polarized Light (1977), North-Holland, New York
40. Aspnes D.E. Thin Solid Films 89 (1982) 249
41. Petrik P., Biró L.P., Fried M., Lohner T., Berger R., Schneider C., Gyulai J., and Ryssel H. Thin Solid Films 315 (1998) 186
42. Hu W.S., Liu Z.G., Sun J., Zhu S.N., XU Q.Q., Feng D., and Ji Z.M. J. Phys. Chem. Solids 58 (1997) 853
43. Synowicki R.A. Thin Solid Films 394 (1998) 313
44. Liu Y.C., Tung S.K., and Hseih J.H. J. Cryst. Growth 287 (2006) 105
45. Caglar Y., Ilican S., Caglar M., and Yakuphanoglu F. Spectrochim. Acta, Part A 67 (2007) 1113
46. Zhang J.P., He G., Zhu L.Q., Liu M., Pan S.S., and Zhang L.D. Appl. Surf. Sci. 253 (2007) 9414
47. Cetinorgu E., Goldsmith S., Zhitomirsky V.N., Boxman R.L., and Bungay C.L. Semicond. Sci. Technol. 21 (2006) 1303