Stopping power of different ions in Si measured with a bulk sample method and bayesian inference data analysis

AIP Conference Proceedings

Volumn 1099, Issue , 2009, Pages 331-334

  Barradas, N P ^a,b   Alves, E ^a,b   Siketic Z ^c   Radović, I Bogdanović ^c  

^a INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^b CENTRO DE FÍSICA NUCLEAR DA UNIVERSIDADE DE LISBOA   (Portugal)

^c RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

Electronic stopping; RBS; Silicon

Indexed keywords

EID: 65349193799     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3120044     Document Type: Conference Paper

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