Measurements of electron inelastic mean free paths in materials

Physical Review Letters

Volumn 104, Issue 20, 2010, Pages

  Bourke, J D ^a   Chantler, C T ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BALLISTIC ELECTRON EMISSION MICROSCOPY; DIVERSE FIELDS; ELECTRON ENERGIES; ELECTRON INELASTIC MEAN FREE PATHS; ENHANCED SENSITIVITY; HIGH-ACCURACY MEASUREMENTS; INELASTIC MEAN FREE PATH; MEASUREMENT TECHNIQUES; STRUCTURAL DETERMINATION; THEORETICAL PREDICTION; X RAY ABSORPTION FINE STRUCTURES; XAFS;

DISSOCIATION; ELECTRON DIFFRACTION; ELECTRON ENERGY LEVELS; UNCERTAINTY ANALYSIS;

ELECTRONS;

EID: 77953084112     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.104.206601     Document Type: Article

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