Elastic scattering corrections in AES and XPS. III. Behaviour of electron transport mean free path in solids for kinetic energies in the range 100 eV < e < 400 eV

Surface and Interface Analysis

Volumn 25, Issue 6, 1997, Pages 447-453

  Cumpson, P J ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

AES; Elastic scattering; IMFP; Transport mean free path; XPS

Indexed keywords

ATOMS; AUGER ELECTRON SPECTROSCOPY; ELECTRON EMISSION; MATHEMATICAL MODELS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELASTIC SCATTERING; ELECTRON TRANSPORT MEAN FREE PATHS; INELASTIC MEAN FREE PATHS (IMFP); LEVINSON THEOREM; RAMSAUER TOWNSEND EFFECTS;

ELECTRON TRANSPORT PROPERTIES;

EID: 0031165414     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199706)25:6<447::AID-SIA272>3.0.CO;2-Q     Document Type: Article

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