Highly accurate frequency/time domain characterization of transmission lines and passives for SiP applications up to 65 GHz

69th ARFTG Microwave Measurements Conference - Addressing Metrology Needs for Future High-Speed Information and Communications Systems

Volumn , Issue , 2007, Pages

  Wojnowski, Maciej ^a   Engl, Mario ^a   Weigel, Robert ^b  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION ALGORITHM; CHARACTERISTIC IMPEDANCE; COMPLEX CHARACTERISTICS; DOMAIN CHARACTERIZATION; HIGH-RESISTIVITY SUBSTRATE; MCM-D TECHNOLOGY; MEASUREMENT RESULTS; METALLIZATIONS; PASSIVE DEVICES; PROBE TIPS; REFERENCE PLANE; SHUNT ADMITTANCES; SIP APPLICATION; SPIRAL INDUCTOR; TIME DOMAIN; TIME-DOMAIN METHODS; TRANSMISSION LINE;

ELECTRIC LINES; MICROWAVE MEASUREMENT; MICROWAVES; TRANSMISSION LINE THEORY;

TIME DOMAIN ANALYSIS;

EID: 77953076343     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2007.5456341     Document Type: Conference Paper

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